Teradyne, Inc.

Schlumberger Technologies, Inc.

Vladimir Vayner

Paul J Duval

Roger Allen Sinsheimer

Brian G Donovan

Gary Fowler

Steve Uzdanovich

Frank Parrish

Neal T Sullivan

Brian Charles Wadell

David Walter Lewinnek

Brian J Bosy

Allan I Rubin

Ira Rosenberg

Timothy Daniel Lyons

Andreas Flieher

Brandon E Creager

Michael Peter Hascher

David F High

An example manipulator for transporting a test head includes: a tower having a base and a track, with the track being vertical relative to the base; an arm to enable support for the test head, with the arm being connected to the track to move the test head vertically relative to the tower; one or more motors to drive movement of the arm along the track; and pneumatic cylinders to control movement of the arm to cause the test head to apply an amount of force to a peripheral device.

Manipulator in automatic test equipment

An example method includes: for a component supported by an air bearing, detecting a speed of movement of the component relative to a predefined location, the air bearing generating an air flow to elevate the component relative to a ground plane; and controlling the air bearing based, at least in part, on the speed detected.

Braking system

An example circuit board structure includes: a substrate; and vias that are electrically conductive and that pass through the substrate to enable electrical connection through the circuit board structure. The substrate is thinner, and lengths of the vias are shorter, in first areas of the circuit board structure that deliver first speed signals than in second areas of the circuit board structure that deliver second speed signals and power. The first speed signals have a shorter rise time than the second speed signals.

Pocketed circuit board

An automated test equipment system includes a peripheral including first mechanical alignment features; a test head including second mechanical alignment features arranged in a pattern corresponding to the first mechanical alignment features and configured to engage the first mechanical alignment features. The automated test equipment system also includes a laser assisted alignment system including laser devices mounted to the peripheral and operable to emit laser beams; target plates mounted to the test head and including target symbols visible on surfaces of the target plates. The target symbols are arranged in a pattern corresponding to the laser devices such that, when laser beams from the laser devices are substantially aligned with the target symbols, the first mechanical alignment features are substantially aligned with the second mechanical alignment features.

Laser targeting mechanism

An automated test equipment interface system, e.g., for attaching a handler to a test head, includes a device interface board assembly. The device interface board assembly includes a stiffener frame having a frame body that is configured for attachment to a test head, alignment brackets connected to the frame body, and cam followers connected to the alignment brackets. The system also includes a docking device. The docking device includes a docking plate that is configured for attachment to a handler, pull-down ramps connected to the docking plate and movable between a retracted position and an extended position, an actuator operable to initiate movement of the pull-down ramps, and a coupling that translates movement of the actuator to corresponding movements of the pull-down ramps. The pull-down ramps can include cam surfaces that are configured to engage the cam followers of the device interface board assembly during movement between the retracted and extended positions to pull the device interface board assembly towards the docking plate.

Automated test equipment interface

A manipulator for supporting heavy as well as lighter test heads in a small footprint includes a body and an interface for supporting a test head from behind. The interface includes a first portion fixedly attached to the body and a second portion fixedly attached to the rear of the test head. The first and second portions of the interface are rotatably coupled together to allow rotation of the test head about its approximate center of mass. Although the weight of the test head is entirely borne from the rear, the test head can still be moved with relatively little applied force, thereby satisfying the requirements for compliant docking.

Rear-mounted gimbal for supporting test head

In instruments such as Wien filters, electrostatic and/or magnetic pole pieces must be mounted on and secured to a supporting structure with a very high degree of dimensional precision, usually by brazing. To that end, a fixture is provided for holding the parts to be assembled in precise relationship and to press the pole pieces into engagement with the supporting structure while the securing operation is being carried out. The pressing is accomplished by a gravity-produced force which is, therefore, independent of positional accuracies caused by very high temperatures, such as are encountered during brazing.

Fixture for assembling parts of a device such as a Wien filter

A charged particle filter such as a Wien filter in which components used as the pole pieces and electrodes are precisely and reliably secured to a supporting structure through which they extend and to which they are brazed. Electrical insulating gaps in the magnetic circuit are located very remotely from the pole faces of the pole pieces so as to minimize any adverse effect of the gaps on the produced magnetic field.

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Needham, MA, United States of America

Vladimir Vayner