Micron Technology Incorporated

Lodestar Licensing Group LLC

Intel Corporation

Vladimir Mikhalev

Michael A Smith

H Jim Fulford

Haitao Liu

Michael P Violette

Aaron M Schoenfeld

Zia Alan Shafi

Puneet Sharma

Daniel B Penney

William Chad Waldrop

Yongjun Jeff Hu

Feng Lin

Gordon A Haller

Lequn Jennifer Liu

Mark Alan Helm

Kenneth William Marr

Guangyu Huang

A memory device includes an array of memory cells and a plurality of bit-lines with each bit-line connected to a respective set of memory cells of the array of memory cells. The memory device includes a memory subsystem having first and second memory circuits. Each first memory circuit can be disposed laterally adjacent to a second memory circuit. Each first memory circuit includes a first bit-line connection and each second memory circuit including a second bit-line connection, the first and second bit-line connections can connect to respective bit-lines. Each first bit-line connection is disposed on a first bit-line connection line of the memory subsystem and each second bit-line connection is disposed on a second bit-line connection line of the memory subsystem, and the second bit-line connection line can be offset from the first bit-line connection line by a predetermined distance that is greater than zero.

Reduced pitch memory subsystem for memory device

A capacitor structure comprises a first conductive region having a first conductivity type and a second conductive region having a second conductivity type different than the first conductivity type. The first conductive region comprises a first protrusion portion and a second protrusion portion. The second conductive region comprises a protrusion portion. The capacitor structure further comprises a first dielectric overlying the first protrusion portion of the first conductive region, and a first conductor overlying the first dielectric. Additionally, the capacitor structure comprises a terminal of a diode overlying the second protrusion portion of the first conductive region and the protrusion portion of the second conductive region. The terminal of the diode comprises a second conductor isolated from the first conductor.

Capacitor structures

Apparatus having a transistor connected between a voltage node and a load node, where the transistor includes a dielectric material overlying a semiconductor material including fins and having a first conductivity type, a conductor overlying the dielectric material, first and second extension region bases formed in the semiconductor material and having a second conductivity type, first and second extension region risers formed overlying respective first and second extension region bases and having the second conductivity type, and first and second source/drain regions formed in respective first and second extension region risers and having the second conductivity type at greater conductivity levels than their respective extension region risers, as well as method of forming similar transistors.

Transistors with raised extension regions and semiconductor fins

Capacitor structures, and apparatus containing similar capacitor structures, might include a first conductive region having a first portion and second and third portions extending from an upper surface of its first portion, a second conductive region having a first portion and a second portion extending from an upper surface of its first portion, a dielectric overlying the second portion of the first conductive region, a conductor overlying the dielectric, and a conductive element overlying the third portion of the first conductive region and overlying the second portion of the second conductive region, wherein the first conductive region has a first conductivity type and the second conductive region has a second conductivity type different than the first conductivity type.

Capacitor structures and apparatus containing such capacitor structures

Transistors, and memories including such transistors, might include an active area having a first conductivity type, first and second source/drain regions in the active area and having a second conductivity type, and a plurality of control gates between the first and second source/drain regions and the second source/drain region, wherein each control gate of the plurality of control gates includes a respective first control gate portion overlying a first side of the active area, and a respective second control gate portion connected to its respective first control gate portion that is either adjacent to a second side of the active area orthogonal to the first side of the active area, or underlying a second side of the active area opposite the first side of the active area.

Multi-gate transistors and memories having multi-gate transistors

Memory systems and devices with source plate discharge circuits (and associated methods) are described herein. In one embodiment, a memory device includes (a) a plurality of memory cells, (b) a source plate electrically coupled to the plurality of memory cells, and (c) a discharge circuit. The discharge circuit can include a bipolar junction transistor device electrically coupled to the source plate and configured to drop a voltage at the source plate by, for example, discharging current through the bipolar junction transistor device. In some embodiments, the bipolar junction transistor device can be activated using a low-voltage switch or a high-voltage switch electrically coupled to the bipolar junction transistor. In these and other embodiments, the bipolar junction transistor device can operate in an avalanche mode while discharging current to drop the voltage at the source plate.

Memory with a source plate discharge circuit

Transistors having a control gate isolated from a first region of semiconductor material having a first conductivity type, first and second source/drain regions having a second conductivity type different than the first conductivity type and formed in the first region of semiconductor material, and a second region of semiconductor material having the first conductivity type in contact with the first region of semiconductor material, wherein the first region of semiconductor material is between the control gate and the second region of semiconductor material, wherein the first region of semiconductor material has a first width, and wherein the second region of semiconductor material has a second width, less than or equal to the first width, as well as memory containing such transistors.

Apparatus having integrated circuit well structures of vertical and/or retrograde profiles

Methods of forming a capacitor structure might include forming a first and second conductive regions having first and second conductivity types, respectively, in a semiconductor material, forming a dielectric overlying the first and second conductive regions, forming a conductor overlying the dielectric, and patterning the conductor, the dielectric, and the first and second conductive regions to form a first island of the first conductive region, a second island of the first conductive region, an island of the second conductive region, a first portion of the dielectric overlying the first island of the first conductive region separated from a second portion of the dielectric overlying the second island of the first conductive region and the island of the second conductive region, and a first portion of the conductor overlying the first portion of the dielectric separated from a second portion of the conductor overlying the second portion of the dielectric.

Methods of forming capacitor structures

Multi-gate transistors, as well as apparatus containing such multi-gate transistors and methods of forming such multi-gate transistors, might facilitate gating voltages in integrated circuit devices. Such multi-gate transistors might include an active area having a first conductivity type, a first source/drain region in the active area and having a second conductivity type different than the first conductivity type, a second source/drain region in the active area and having the second conductivity type, and a plurality of control gates adjacent the active area between the first source/drain region and the second source/drain region, wherein each control gate of the plurality of control gates comprises a respective plurality of control gate portions, and wherein, for a particular control gate of the plurality of control gates, each control gate portion of its respective plurality of control gate portions is adjacent the active area in a respective plane of a plurality of different planes.

Multi-gate transistors, apparatus having multi-gate transistors, and methods of forming multi-gate transistors

Capacitor structures including a first island of a first conductive region and a second island of the first conductive region having a first conductivity type, an island of a second conductive region having a second conductivity type different than the first conductivity type, a dielectric overlying the first island of the first conductive region, a conductor overlying the dielectric, and a terminal of a diode overlying the second island of the first conductive region and overlying the island of the second conductive region.

Methods of forming a portion of an integrated circuit include forming a patterned mask having an opening and exposing a surface of a semiconductor material, forming a first doped region at a first level of the semiconductor material through the opening, and isotropically removing a portion of the patterned mask to increase a width of the opening. The methods further include forming a second doped region at a second level of the semiconductor region through the opening after isotropically removing the portion of the patterned mask, wherein the second level is closer to the surface of the semiconductor material than the first level.

Methods of forming integrated circuit well structures

Semiconductor devices are described, along with methods and systems that include them. One such device includes a diffusion region in a semiconductor material, a terminal coupled to the diffusion region, and a field plate coupled to the terminal and extending from the terminal over the diffusion region to shield the diffusion region. Additional embodiments are also described.

Growing community of inventors

Boise, ID, United States of America

Vladimir Mikhalev