Sandisk Technologies Inc.

Sandisk Corporation

Vladimir Kovalev

Matt Davidson

Baojing Liu

A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.

Test mode soft reset circuitry and methods

An integrated circuit chip includes a scan-in pin, a scan clock pin, and a test controller. The scan-in pin and the scan clock pin receive a test program for the type of test mode and a soft-reset pattern. A state machine is configured to direct sampling of a scan clock waveform provided through the scan clock pin as dictated by transitions of a scan-in waveform provided through the scan-in pin. The state machine identifies a bit match from the sampled scan clock waveform upon executing the soft-reset pattern. The identified bit match triggers a soft reset which eliminates the need for an extra reset pin, when testing in scan mode.

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Fremont, CA, United States of America

Vladimir Kovalev