Panalytical B.v.

Koninklijke Philips Corporation N.V.

U.S. Philips Corporation

Malvern Panalytical B.v.

Vladimir Kogan

Detlef Beckers

Klaus-Jürgen Steffens

Jorg Bolze

Harald G Schweim

Christian W Lehmann

Klaus-Jurgen Steffens

A sample holderfor holding a capillaryfor X-ray analysis has a first thermal transport memberon the base portionon one side of a longitudinal slitand a second thermal transport memberon the base portionon the other side. The thermal transport membersare compressed between a frameand the base portionin the transverse direction to urge the edges of the first and second thermal transport members together, to hold a capillarylongitudinally aligned with the longitudinal slit

Sample holder for X-ray analysis

Angle dispersive X-ray diffraction is used to test pharmaceutical products including a dosage form inside packaging, for example a tablet inside a blister pack, without removing the dosage form from the packaging. The dosage form is aligned with a measurement system having an X-ray source for generating X-rays, X-ray optics, and an X-ray detector for detection of X-rays. Then, at least one X-ray signature is measured on a predetermined location on the dosage form. The measured X-ray signature is compared with reference X-ray signatures in a data library.

X-ray detection in packaging

An X-ray scattering chamberincludes a housingthat may be mounted in X-ray diffraction equipment between an X-ray sourceand an X-ray detectorfor example on goniometer arm. The housingincludes sample holderand beam conditioning optics, but the system also makes use of primary opticsoutside the housing. The equipment is suitable for SAXS and/or SAXS-WAXS.

X-ray diffraction equipment for X-ray scattering

A method of correcting for aberrations in scattering data is described which does not require prior knowledge about the sample microstructure properties or calculations based on the modelling of peak locations. In an example, X-ray scattering apparatus integrates a correction device arranged to automatically calculate and output aberration corrected output X-ray pattern using the aberration Fourier presentation F(H,2&#x3b8;) dependent from the scattering angle 2&#x3b8; and the Fourier transform of the measured X-ray scattering pattern F(H).

Apparatus and method for correcting for aberrations

In apparatus for radiation analysis, for example, X-ray spectrometers, the aperture angle of the analysing radiation beam is often desired to vary during the measuring process. The aperture angle of the radiation beam is determined, for example, by the length of the collimating elements in the collimator. In accordance with the invention, this is achieved by displacing or rotating the collimator through the radiation beam so that the collimating element length L exposed to the radiation beam can be varied in consequence. A collimator comprising rectangular plates (Soller collimator) can be rotated around a shaft perpendicular to the plates, or a collimator comprising X-ray fibres can be arranged with varying fibre lengths and displace them through the radiation beam transversely to the longitudinal direction of the fibres.

Apparatus for radiation analysis with a variable collimator

An apparatus for X-ray analysis of materials advantageously utilizes a parabolic multilayer mirror for parallelizing the X-rays. Moreover, it may be desirable to monochromatize the parallelized radiation, for example by means of a crystal monochromator. According to the invention an influencing device for the X-rays is constructed as a single mechanical unit comprising a combination of an X-ray mirror ( ) and a monochromator ( ). This unit ( ) can be arranged in the analysis apparatus in at least two positions ( ) in such a manner that the X-rays travel via the X-ray mirror ( ) and the monochromator ( ) in the first position ( ) whereas the X-rays travel only via the X-ray mirror ( ) in the second position ( ). Consequently, no separate units comprising only an X-ray mirror or a combination of an X-ray mirror and a monochromator are required, so that a substantial saving in costs is achieved.

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Almelo, Netherlands

Vladimir Kogan