Texas Instruments Corporation

Vivek Varier

Vadim Valerievich Ivanov

Srinivas Kumar Pulijala

Jerry Doorenbos

Sharat Chandra Rudrasamudram

Akhilesh Kesavanunnithan

Henry Manoj D'Souza

In an example, a system includes an amplifier having an output stage configured to provide an output voltage, where the output stage includes a p-channel transistor and an n-channel transistor. The system includes a sense transistor having a gate coupled to a gate of the p-channel transistor, where the sense transistor is configured to sense a current of the p-channel transistor and produce a sense current. The system includes a current mirror coupled to the sense transistor and configured to provide the sense current to a gate of a control transistor, the control transistor having a source coupled to the gate of the p-channel transistor. The system includes a reference current source coupled to the control transistor and configured to provide a reference current. The control transistor is configured to adjust a gate current provided to the p-channel transistor based on comparing the sense current to the reference current.

Class AB monticelli output stage design with bias temperature instability tolerance

An example apparatus includes: An amplifier comprising folded cascode circuitry having an input and an output, an input pair coupled to the input, clamp circuitry including: a first transistor having a first drain, a first source, and a first gate, the first source coupled to the output, a second transistor having a second drain, a second source, and a second gate, the second drain coupled to the first drain and the second gate coupled to the first drain and second drain, a third transistor having a third drain, a third source, and a third gate, the third source coupled to the output, and a fourth transistor having a fourth drain, a fourth source, and a fourth gate, the fourth drain coupled to the third drain and the fourth gate coupled to the third drain and the fourth drain.

Methods and apparatus to improve performance of amplifiers

Methods and apparatus for determining non-linearity in analog-to-digital converters are disclosed. An example apparatus includes a signal interface to receive an output of an analog-to-digital converter (ADC), the output corresponding to a periodic signal transmitted to the ADC; a signal transformer to determine at least one of a harmonic phase or a harmonic amplitude corresponding to the output; and an integral non-linearity (INL) term calculator to determine the INL of the ADC based on a characteristic of the periodic signal and the at least one of the harmonic phase or the harmonic amplitude.

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Austin, TX, United States of America

Vivek Varier