Nuvoton Technology Corporation

Vivek Ningaraju

Po-An Chen

Gene Sheu

Vinay Suresh

Subramanya Jayasheela Rao

Syed Neyaz Imam

Pooja Ravindra Deshmane

Aanand

Monika Bharti

Syed Sarwar Imam

Shaik Mastanbasheer

Ching-Yuan Liao

A semiconductor device and a semiconductor structure are disclosed. The semiconductor device includes a substrate, a first III-V compound layer, a second III-V compound layer, a source, a drain and a gate stack structure. The first III-V compound layer is disposed on the substrate. The second III-V compound layer is disposed on the first III-V compound layer. The source and the drain are disposed on opposite sidewall boundaries of the second III-V compound layer. The gate stack structure is disposed on the second III-V compound layer. The gate stack structure includes a first gate and a second gate. The first gate is disposed on the second III-V compound layer. The second gate is disposed on and electrically isolated from the first gate. The second gate is electrically coupled to the source.

III-V field effect transistor and semiconductor structure

A high-voltage semiconductor device includes a semiconductor substrate having a first conductivity type. A first well region is disposed on the semiconductor substrate and has the first conductivity type. A second well region is adjacent to the first well region and has a second conductivity type opposite to the first conductivity type. A first source region and a first drain region is respectively disposed in the first well region and the second well region, wherein the first source region and the first drain region has the second conductivity type. A first gate structure is disposed on the first well region and the second well region, and a buried layer is disposed in the semiconductor substrate and has the first conductivity type, wherein the buried layer is overlapped with the first well region and the second well region, and the buried layer is directly below the first source region.

High-voltage semiconductor devices having buried layer overlapped with source and well regions

A high-voltage semiconductor device includes a semiconductor substrate having a first conductivity type, and a first high-voltage well region disposed in the semiconductor substrate and having a second conductivity type that is opposite to the first conductivity type. The high-voltage semiconductor device also includes a first buried layer disposed on the first high-voltage well region and having the first conductivity type, and a second buried layer and a third buried layer disposed on the first high-voltage well region and having the second conductivity type, wherein the first buried layer is between the second buried layer and the third buried layer. The high-voltage semiconductor device further includes a source region and a drain region disposed on the first buried layer and having the second conductivity type.

High-voltage semiconductor devices and methods for manufacturing the same

A high-voltage semiconductor device includes a semiconductor substrate having a first conductivity type, a source region and a drain region disposed on the semiconductor substrate. The drain region has a second conductivity type that is the opposite of the first conductivity type, and the source region includes a part having the first conductivity type and another part having the second conductivity type. The device includes a first and a second isolation structures disposed on two opposite sides of the drain region. The first isolation structure is between the source and the drain region. The device includes a first well region disposed below the second isolation structure. The top surface of the first well region is adjacent to the bottom surface of the second isolation structure. In addition, the device includes a first buried layer disposed in the semiconductor substrate and that overlaps the first well region.

High-voltage semiconductor device

Semiconductor devices and methods of fabricating the same are provided. The semiconductor device includes a substrate having a first conductive type. A second conductive type first epitaxial layer is disposed over the substrate. A second conductive type second epitaxial layer is disposed over the second conductive type first epitaxial layer. An active region of the substrate includes a first conductive type buried layer in the second conductive type first and second epitaxial layers. A first conductive type doped well region is disposed in the second conductive type second epitaxial layer. A second conductive type heavily doped region is disposed over the first conductive type doped well region. A first trench isolation feature is disposed in the substrate. In addition, a first conductive type doped region is disposed between a bottom surface of the first trench isolation feature and the first conductive type buried layer.

Semiconductor devices and methods of fabricating the same

High-voltage semiconductor devices are provided. The high-voltage semiconductor device includes a substrate having a first conductive type and an epitaxial layer having a second conductive type disposed on the substrate. The epitaxial layer includes a high-voltage unit, a low-voltage unit disposed around the high-voltage unit and a level-shift unit disposed between the high-voltage unit and the low-voltage unit. The level-shift unit includes a source region, a drain region having disposed between the source region and the high-voltage unit, wherein the drain region is electrically connected to the high-voltage unit by a drain electrode disposed above the drain region. The level unit includes a gate electrode disposed between the source region and the drain region. The high-voltage semiconductor device also includes an isolation structure disposed between the high-voltage unit and the low-voltage unit, and the isolation structure is disposed directly under the drain electrode.

A PIN diode is formed on an insulating structure on a substrate of semiconductor. The insulating structure is disposed on a high voltage doped region in the substrate. The PIN diode includes a semiconductor layer, disposed on the insulating structure. The semiconductor layer includes a first doped region of a first conductivity type, at least one second doped region of a second conductivity type, and at least one intrinsic region without being doped or lightly doped between the first doped region and the at least one second doped region. The first conductive type is opposite to the second conductivity type. At least one interconnection structure is disposed on the insulating structure to electrically connect the at least one intrinsic region to the high voltage doped well.

High voltage PIN diode

A semiconductor device including a substrate, an isolation structure, a diode element, and a first metal layer is provided. The isolation structure is located in the substrate. The diode element is located on the isolation structure. The diode element includes a p-type doped region, an n-type doped region, and an intrinsic region, and the intrinsic region is located between the p-type doped region and the n-type doped region. The p-type doped region and the n-type doped region located on two sides of the diode element respectively form ohmic contacts. The first metal layer and the intrinsic region of the diode element are electrically connected and form a Schottky contact, so as to constitute at least one Schottky barrier diode.

Semiconductor device

Provided are a diode, a junction field effect transistor (JFET), and a semiconductor device that have a top doped region. A dopant concentration gradient of the top doped region at one side is different from the dopant concentration gradient of the top doped region at an opposite side. The top doped region is able to increase a breakdown voltage of the device and decrease an on-state resistance (Ron) of the device.

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Mysore, India

Vivek Ningaraju