Acellent Technologies, Inc.

Vishnuvardhan Janapati

Fu-Kuo Chang

Irene Li

Sang Jun Lee

Methods and apparatuses for monitoring a first structure at least partially according to properties of a second structure. One such method comprises determining a first relationship between a first variable and a second variable, wherein the first variable represents sizes of actual damage to the second structure, and the second variable represents sizes of simulated damage on the second structure; determining a second relationship between a third variable and a fourth variable, wherein the third variable represents sizes of simulated damage on the first structure, and the fourth variable represents values of a damage index determined for the simulated damage on the first structure; and determining an estimate of damage to the first structure according to the first and second relationships.

Growing community of inventors

Palo Alto, CA, United States of America

Vishnuvardhan Janapati