Google Inc.

Arris Enterprises LLC

Vipul Rathod

Jamie J Swift

Reza A Saedi

Dennis Patrick Conroy

David M Thibeault

David Francis Lewandowski

Thomas M Weiss

A test point circuit includes a main RF signal path (e.g., transmission line, lumped-element network, etc.), a test point RF signal circuit, a test point structure having a center conductor and corresponding grounded sleeve and being configured for connecting to a test probe for monitoring the RF signal carried through the main RF signal path, and a switch between the main RF signal path and the test point RF signal circuit. In the open position of the switch, the signal in the main RF signal path is prevented from propagating to the center conductor of the test point structure. In the closed position of the switch, the RF signal can propagate from the main RF signal path to the center conductor of the test point structure. The test probe mated to the test point structure can then measure or monitor the RF signal carried through the main RF signal path.

Dis-engaging test point

An improved optical fiber management bridgecan comprise an optical hingefor an electronics communications devicewhich is especially useful for a broadband network. The electronics communications device can have a housingfor enclosing an electronics packagecomprising at least one optical moduleand optical fibers. The optical bridge can have optical surfacesfor supporting portions of the optical fiberswhich are routed and extend between the topand baseof the housing. The optical bridge can have an intermediate portionfor accommodating safe transition of the optical fibersover the hinge lineof the housing

Optical fiber management bridge

Growing community of inventors

North Wales, PA, United States of America

Vipul Rathod