Texas Instruments Corporation

Vineet Mishra

Visvesvaraya Appala Pentakota

Shakti Shankar Rath

Greg Charles Baldwin

Kamel Benaissa

Rajavelu Thinakaran

Gautam Salil Nandi

Samala Sreekiran

Ananth Kamath

Nitin Kumar Agarwal

Jagannathan Venkataraman

Jayawardan Janardhanan

Goutam Dutta

Anand Hariraj Udupa

Sreekiran Samala

Meghna Agrawal

Ravishankar S Ayyagari

Rishubh Khurana

Mahadevan Shankara Venkiteswaran

Chun Chieh Lee

Rajiv Shrikant Mantri

Vinod Srinivasan Paliakara

Asif Soyebali Surti

Circuitry for providing an oscillating output signal. The circuitry comprises a transconductance circuit having a first input, a second input, and an output. The circuitry further comprises an oscillator circuit coupled to receive voltage from the output of the transconductance circuit, wherein the oscillating output signal is responsive to an output of the oscillator circuit. Also included are circuitry for providing a first voltage to the first input of the transconductance circuit and a frequency controlled circuit for providing a second voltage to the second input the transconductance circuit. The second voltage is response to a frequency of operation of the frequency controlled circuit, and the frequency of operation of the frequency controlled circuit is responsive to feedback from the output of the oscillator circuit.

Oscillator with frequency control loop

Circuits and methods for reducing input dependent capacitor DAC switching current in flash-successive approximation register (SAR) analog-to-digital converters (ADCs) are disclosed. An ADC includes an M-bit flash ADC and N-bit SAR ADC. In flash conversion phase, flash ADC outputs digital signal including most significant M-bits of N-bits of digital output code for a sampled analog signal. SAR ADC includes capacitor DAC and digital engine. The capacitor DAC includes first and second set of capacitors, where first ends of the first and second set of capacitors are coupled to common terminal. The digital engine provides the N-bits of digital output code in SAR conversion phase based on the digital signal and a voltage (Vcom) at the common terminal. During flash conversion phase, second ends of the first set of capacitors are connected to Vref and Vgnd respectively so as to generate a voltage level corresponding to the digital signal as Vcom.

Reduction of input dependent capacitor DAC switching current in flash-SAR analog-to-digital converters

A driver circuit includes a first driver amplifier that is configured to generate a first output in response to a first reference voltage input and a first audio input; a second driver amplifier that is configured to generate a second output in response to the first reference voltage and a second audio input; and a common mode (CM) amplifier, coupled to the first driver amplifier and the second driver amplifier. The CM amplifier is configured to generate an output in response to a second reference voltage input, the first reference voltage input being a divided version of the output. Gains of the first driver amplifier, second driver amplifier and the CM amplifier are equal. Noise at the output appears across a plurality of resistors coupled at the outputs of the first driver amplifier, second driver amplifier and the CM amplifier and cancels with respect to the output of the CM amplifier.

CM amplifier divided output supplying first, second, CM amplifier inputs

A sampled CMOS switch includes first and second NMOS devices in series between input and output nodes. The first and second NMOS devices are activated by a sample signal. A pair of low-voltage DEPMOS devices is connected in a 'T' configuration between the input and output nodes. The low-voltage DEPMOS devices are activated by an inverted sample signal. A feedback circuit includes the DEPMOS devices together with a third high-voltage NMOS device and a current source. The third NMOS device is controlled by a signal on the input node. A switch switchably connects an analog voltage source to a source of the third NMOS device and gates of the DEPMOS devices in accordance with a phase of an inverted sample signal. The construction of the sampled CMOS switch enables the protection of the gate oxide insulation of the low-voltage DEPMOS transistors from high voltage damage.

Switch architecture at low supply voltages

An integrated circuit with a core PMOS transistor formed in a first n-well and an isolated DENMOS (iso-DENMOS) transistor formed in a second n-well where the depth and doping of the first and second n-wells are the same. A method of forming an integrated circuit with a core PMOS transistor formed in a first n-well and an iso-DENMOS transistor formed in a second n-well where the depth and doping of the first and second n-wells are the same.

Compensated isolated p-well DENMOS devices

A continuous-time sigma-delta analog to digital converter (CTSD ADC) includes a comparator that samples the time integral of an analog signal at each rising edge and falling edge of a sampling clock. A feedback block, operating as a digital to analog converter, receives the outputs of the comparator and generates corresponding analog signals also at each rising and falling edge of the sampling clock. The feedback blocks are implemented as either switched-resistor or switched-current circuits. High signal-to-noise ratio (SNR) is achieved in the CTSD ADC without the need to use very high sampling clock frequencies. Compensation for excess loop delay is provided using a local feedback technique. In an embodiment, the sigma delta modulator in the CTSD ADC is implemented as a second order loop, and the comparator as a two-level comparator.

Achieving high dynamic range in a sigma delta analog to digital converter

A low noise current steering digital-to-analog converter (DAC). The DAC includes a current reference for generating a bias current that biases a set of current elements. The set of current elements includes a reference element. The current reference includes a reference amplifier and a reference arm. The reference arm includes a reference resistor and the reference element. The DAC further includes a switch periodically coupling each current element including the reference element, to the reference resistor and an output of the DAC. This rotates the set of current elements and attenuates flicker noise from each of the set of current elements.

Low noise current steering DAC

A method and system is provided for determining noise components of an analog-to-digital converter. In one aspect of the invention, a method comprises providing an input signal to a signal input and a clock input of the ADC, outputting a plurality of samples at a sampled phase on the input signal for a plurality of sampled phases, and determining a jitter noise factor value, a reference noise factor value, and a total noise spectrum based on the plurality of samples for each of the plurality of sampled phases. A least means square algorithm is performed on the plurality of jitter noise factor values, reference noise factor values, and total noise spectra to estimate at least one of a jitter noise component and a reference noise component.

Method and system for determining noise components of an analog-to-digital converter

A clamping circuit containing a transistor and a current amplifier. The transistor is designed to turn on when the voltage at a node exceeds (falls below) a specified upper (lower) level. The current amplifier is designed to draw substantial amount of current when the transistor is turned on to clamp the voltage at the node to the desired level.

Clamping circuit

Low voltage transistors are used in high voltage environment. The low voltage transistors may be used in the path of processing of a signal to increase the throughput performance. By using high voltage supply associated with the high voltage environment, a higher SNR may be attained. Various techniques are implemented to ensure that the low voltage transistors are not damaged by prolonged exposure to high voltages.

Enhancing SNR and throughput performance of integrated circuits

An ADC implemented according to an aspect of the present invention contains a non-zero bit stage followed by a zero-bit stage. The non-zero bit stage generates a sub-code, which is used in generating a digital code corresponding to an input analog signal, and the zero-bit stage does not provide any such sub-codes. Such a feature may be attained by using a gain amplifier provided according to another aspect of the present invention. The gain amplifier contains a main-amplifier which operates as a zero bit stage, and is also used by the non-zero bit stage. The same capacitance value may be maintained between the input terminal and output terminal of the main-amplifier to implement the zero bit stage, which enables the main-amplifier to be implemented with a low gain.

High speed gain amplifier and method in ADCs

A delay locked loop clock generation circuit () includes a delay locked loop circuit (), a dummy delay line (), and a watch dog circuit (). The delay locked loop circuit includes a delay line (), a phase detector (), and a charge pump circuit () having an input connected to the output () of the phase detector and an output () producing a delay control signal (Vctrl) coupled to the stages of the delay line of the delay locked loop circuit. The stages of the delay line are precisely matched to those of the dummy delay line (). Tap points of the dummy delay line are connected to inputs of the watchdog circuit (), which operates to generate control signals (A,B) applied to control the phase detector (and the charge pump circuit (). Tap point signals of the delay line () are decoded to produce clock signals () for a pipeline ADC ().

Dummy delay line based DLL and method for clocking in pipeline ADC

Generating a waveform having one signal level periodically and different signal levels in other durations. Two input signals are received, one having a desired constant level and another having desired signal levels. The desired output waveform is generated by selecting one of the two input signals. As a result, the output waveform may be generated to have (transitions) with high frequency even if the signal levels between adjacent portions are substantially different. Such waveforms are useful to test CDS (correlated double sampling) samplers.

Growing community of inventors

Bengaluru, India

Vineet Mishra