Stmicroelectronics (crolles 2) Sas

Stmicroelectronics S.a.

Nxp B.v.

Stmicroelectronics International N.v.

Stmicroelectronics (alps) Sas

Vincent Huard

Chittoor Parthasarathy

Mickael Denais

Florian Cacho

Pascal Urard

Alok Kumar Tripathi

Silvia Brini

A method for determining a margin of use of an integrated circuit includes monitoring at least one sensor so as to determine at least one physical parameter representative of use of the integrated circuit, evaluating the at least one physical parameter to determine an instantaneous state of aging of the integrated circuit as a function of the at least one physical parameter, and calculating the margin of use for the integrated circuit from a comparison of the instantaneous state of aging with a presumed state of aging. If operation of the integrated circuit is outside the margin of use, at least one operating performance point of the integrated circuit is adjusted so as to bring operation of the integrated circuit back within the margin of use.

Method for estimating an operating profile of an integrated circuit of a system-on-a-chip, and corresponding system-on-a-chip

A flip flop includes a data input, a clock input, a test chain input, a test chain output, a monitoring circuit, and an alert transmission circuit. The monitoring circuit is adapted to generate an alert if the time between arrival of a data bit and a clock edge is less than a threshold. The alert transmission circuit is adapted to apply during a monitoring phase an alert level to the test chain output in the event of an alert generated by the monitoring circuit, and to apply the alert level to the test chain output when an alert level is received at the test chain input.

Flip flop of a digital electronic chip

A system on a chip includes at least one integrated circuit that is configured to operate at least at one operating point. A monitoring circuit acquires at least the cumulative duration of activity of the at least one integrated circuit. An evaluation circuit establish at least one instantaneous state of aging of the at least one integrated circuit based on the at least one cumulative duration of activity. An adjustment circuit operates to change the at least one operating point on the basis of the at least one state of aging of the at least one integrated circuit.

Method for adjusting at least one operating point of at least one integrated circuit of a system on a chip, and corresponding system on a chip

A system-on-a-chip includes an integrated circuit and an estimation circuit. The estimation circuit operates to acquire at least one physical parameter representative of the use of the integrated circuit and determine an instantaneous state of aging of the integrated circuit as a function of the at least one physical parameter. A margin of use of the integrated circuit is then calculated by comparing the instantaneous state of aging with a presumed state of aging.

The disclosure concerns an integrated circuit comprising: a plurality of circuit domains, each circuit domain comprising: a plurality of transistor devices positioned over p-type and n-type wells, the transistor devices defining one or more data paths of the circuit domain; a monitoring circuit adapted to detect when the slack time of at least one of the data paths in the circuit domain falls below a threshold level and to generate an output signal on an output line based on said detection; and a biasing circuit adapted to modify a biasing voltage of the n-type and/or p-type well of the circuit domain.

Method and circuit for integrated circuit body biasing

An integrated circuit comprising at least one MOS-type transistor, further comprising a system for detecting the variations of the electrical quantities of the at least one transistor, and a biasing device modifying the bias voltage of the bulk of the at least one transistor according to the variations measured by the detection system.

Compensation for electric drifts of MOS transistors

A digital electronic device is provided with a first and second sequential logic unit (SS, SS), each for receiving an input signal (D) and for outputting a first and second output signal (Q, QF), respectively. The electronic device furthermore comprises a comparator unit (C) for comparing the first and second output signals (Q, QF) and an adaptive clock generator unit (ACG) for generating a first and second internal clock (CK, CKF) for the first and second sequential logic unit (SS, SS), respectively. In a self-tuning mode, the adaptive clock generator unit (ACG) is adapted to delay the first and second internal clock signals (CK, CKF) with respect to the other internal clock signal (CKF). The delay induced by the adaptive control generator unit (ACG) is dependent on the result of the comparison unit (C). In a normal operation mode the adaptive control generator unit (ACG) is adapted to maintain the delay between the first and second internal clock signals constant.

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Le Versoud, France

Vincent Huard