Koninklijke Philips Corporation N.V.

Vinay Pandit

Vijayananda Jagannatha

Rupesh Vakkachi Kandi

Srinivas Prasad Madapusi Raghavan

Systems and methods are disclosed for generating device test cases for medical imaging devices, which are not only reflective of current actual field usage of the device but also provide outlook on future usage. A probabilistic model of usage patterns is generated from historic data present in the device field logs by mining the current usage patterns. A Deep Long Short Term Memory Neural Network model of the usage patterns is constructed to predict the future usage patterns. Additionally, to capture the changing trends of device usage patterns in the field, predictive models are continuously updated in real time, and the test cases generated log files by the models are integrated into an automated testing system.

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Gokarn, India

Vinay Pandit