Honeywell International Inc.

Vinay Huddar

Balasubramanyam Ravindranath

A method of non-intrusively measuring a memory profile of a thread under test comprises executing a detection thread in parallel with the thread under test, the thread under test executed on a first core of a multi-core processor and the detection thread executed on a second core of the multi-core processor; generating a pattern of cache miss memory reads on the detection thread in order to access a memory shared by the first core and the second core; periodically obtaining read times in the detection thread indicating the amount of time taken to complete the cache miss memory reads generated on the detection thread; and determining the memory profile of the thread under test based on the obtained read times of the detection thread.

Growing community of inventors

Karnataka, India

Vinay Huddar