International Business Machines Corporation

Vikram B Raj

Christopher W Steffen

Glen Arthur Wiedemeier

Chad Andrew Marquart

Erik English

Michael Wayne Harper

Dereje G Yilma

Jeffrey Kwabena Okyere

Venkat Harish Nammi

Nathan Ross Blanchard

James Crugnale

Aspects of the invention include a phase rotator, that is located at a built-in self-test (BIST) path of a receiver, receiving a clock signal from an on-chip clock. The phase rotator shifts the phases of the clock signal. The phase rotator transmits the shifted clock signal to a binary sequence generator, that is located at the receiver. The binary sequence generator outputs a binary sequence, where the binary sequence generator is driven by the shifted clock signal.

Self-contained built-in self-test circuit with phase-shifting abilities for high-speed receivers

Aspects of the invention include a driver arranged at a stand-alone receiver that is configured to receive a binary sequence from a pseudorandom binary sequence (PRBS) generator arranged at the receiver. The driver is configured to adjust the signal characteristics of the binary sequence to simulate channel loss at the receiver. The driver is further configured to output the adjusted binary sequence to a downstream data path of the receiver to enable the receiver to perform a self-test.

Built-in-self-test and characterization of a high speed serial link receiver

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Austin, TX, United States of America

Vikram B Raj