Arm Limited

Lsi Corporation

Avago Technologies General IP (singapore) Pte. Ltd.

Vikash

Rahul Sahu

Kamal Chandwani

Yew Keong Chong

Rajiv Kumar Roy

Andy Wangkun Chen

Rajiv Kumar Sisodia

Paul Darren Hoxey

Sanjay Mangal

Kumaraswamy Ramanathan

Renu Rawat

Sujit Kumar Rout

Manish Trivedi

Fakhruddin Ali Bohra

Lalit Gupta

Shri Sagar Dwivedi

Vivek Nautiyal

Jitendra Dasani

Pradeep Raj

Hsin-Yu Chen

Manish Umedlal Patel

Akash Bangalore Srinivasa

Gaurav Rattan Singla

Sumant Kumar Thapliyal

Manoj Puthan Purayil

Indranil Basu

Mohammed Saif Kunjatur Sheikh

Arjunesh Namboothiri Madhavan

Kanika Malik

Kapil Rathi

Abhishek Kumar Shrivastava

Sabarish Ittamveetil

Rejeesh Ammanath Vijayan

Neelima Gudipati

Various implementations described herein are directed to an integrated circuit having memory circuitry with an array of bitcells. The integrated circuit may include read-write circuitry that is coupled to the memory circuitry to perform read operations and write operations for the array of bitcells. The integrated circuit may include write assist circuitry that is coupled to the memory circuitry and the read-write circuitry. The write assist circuitry may receive a control signal from the read-write circuitry. Further, the write assist circuitry may sense write operations based on the control signal and may drive the write operations for the array of bitcells.

Write assist circuitry

Various implementations described herein are directed to an integrated circuit having an array of bitcells. The integrated circuit may include latch circuitry having a latch for each row of bitcells that latches valid match data into the latch for each row of bitcells. The integrated circuit may include priority encoding circuitry that receives the valid match data from the latch for each row of bitcells. The integrated circuit may include first logic circuitry coupled between the array of bitcells and the priority encoding circuitry to assist with providing the valid match data to the latch circuitry.

Error detection and correction circuitry

A circuit includes a bitcell array having a plurality of bitlines, and an I/O functional unit to read data stored in the bitcell array. The I/O functional unit includes a first multiplexer to select a first input port or a first bitline among a first group of bitlines, a first latch to latch the output of the first multiplexer, a second multiplexer to select a second input port or a second bitline among a second group of bitlines. The second input port is coupled to an output port of the first latch. The I/O functional unit further includes a second latch to latch the output of the second multiplexer.

Memory with a controllable I/O functional unit

Various implementations described herein are directed to an integrated circuit. The integrated circuit may include core circuitry having an array of memory cells and a row decoder that accesses each of the memory cells via a selected wordline and a wordline signal. The core circuitry may operate at a first supply voltage. The integrated circuit may include periphery circuitry having a column decoder that accesses each of the memory cells via a selected bitline. The periphery circuitry may operate at a second supply voltage that is different than the first supply voltage. The periphery circuitry may include voltage differential sensing circuitry that may compare the first supply voltage to the second supply voltage, sense a voltage differential between the first and second supply voltages, and delay the wordline signal when the voltage differential is greater than a threshold voltage.

Voltage aware circuitry

Various implementations described herein may refer to and may be directed to non-discharging read-only memory cells. For instance, in one implementation, an integrated circuit may include a read-only memory (ROM) array including a plurality of ROM cells arranged into a column, where the column is disposed proximate to a bit line and to a reference voltage line. The plurality of ROM cells arranged into the column may include a plurality of non-discharging ROM cells positioned adjacently to one another, where each non-discharging ROM cell has a source terminal, a drain terminal, or both coupled to at least one adjacent non-discharging ROM cell. In addition, the plurality of non-discharging ROM cells may be coupled to the bit line using two or fewer connections.

Non-discharging read-only memory cells

A memory device and method of operating a memory device are provided. The memory device comprises global control circuitry configured to receive a clock signal for the memory device and the memory device is configured to perform a double memory access in response to a single edge of the clock signal. A first internal clock pulse for a first access of the double memory access and a second internal clock pulse for a second access of the double memory access are generated in response to the single edge of the clock signal. The global control circuitry generates a comparison signal in dependence on a comparison between a first bank indicated by the first access and a second bank indicated by the second access, and local bank control circuitry of the second bank is configured to generate the second internal clock pulse in dependence on the comparison signal.

Double pumped memory techniques

Various implementations described herein are directed to an integrated circuit having high density memory architecture. The integrated circuit may include a plurality of bank arrays having multiple segments of bitcells configured to share local control. The integrated circuit may include a plurality of control lines coupling the local control to each of the multiple segments of bitcells. In some instances, during activation of a segment of bitcells by the local control via one of the control lines, another segment of bitcells may be deactivated by the local control via another of the control lines.

High density memory architecture

Various implementations described herein are directed to an integrated circuit for read-write contention. The integrated circuit may include a memory circuit having multiple ports configured to receive data signals corresponding to each port. The integrated circuit may include a contention override circuit providing a contention override signal for each port based on detecting a read-write contention between the ports. The integrated circuit may include a write circuit having multiple passgates for each port including write passgates and contention passgates for each port. The write passgates may be input with data signals from corresponding ports. The contention passgates may be input with data signals from opposing ports based on opposing contention override signals.

Read-write contention circuitry

A read-only memory (ROM) cell has first and second transistors connected in series between a true bit line and a voltage reference (e.g., ground), and third and fourth transistors connected in series between a complement bit line and the voltage reference. The gates of the first and third transistors are connected to a first word line, and the gates of the second and fourth transistors are connected to a second word line. The ROM cell is programmed to store any possible combination of two bits of information by appropriately (i) connecting the node between the first and second transistors to either the true bit line, the complement bit line, or the voltage reference and (ii) connecting the node between the third and fourth transistors to either the true bit line, the complement bit line, or the voltage reference.

Two-bit read-only memory cell

A memory device includes a memory array comprising a plurality of memory cells, and control circuitry coupled to the memory array. The control circuitry comprises at least one dummy memory cell, a feedback-based controller having inputs coupled to respective internal nodes of the dummy memory cell, and write signal generation circuitry coupled to the feedback-based controller and configured to provide one or more write signals for controlling writing of data to portions of the memory array. The feedback-based controller generates a reset signal for application to a reset input of the write signal generation circuitry at least in part as a function of a logic level transition delay of a selected one of the first and second internal nodes of the dummy memory cell.

Memory device having control circuitry for write tracking using feedback-based controller

A memory includes a self-timed column imitating a bitline loading, a self-timed row imitating a self-timed word-line, a self-timed bitcell performing a dummy write in a write cycle, a writer driver coupled to the self-timed bitcell for an actual write, and an edge detection circuit coupled to the self-timed bitcell for tracking a write cycle time.

Memory having self-timed edge-detection write tracking

In embodiments of the invention, a memory circuit includes a static random access memory (SRAM), rows of M sense amplifiers, a global read precharge tracking control circuit controlling a precharge of global read lines, a sense amplifier output tracking circuit generating a reset sense amplifier signal for the sense amplifier control circuits, and a read delay circuit generating a trigger signal for the global read precharge tracking control circuit and the sense amplifier output tracking circuit and performing a fixed delay tracking of a read operation in a read cycle. A dummy global read line is coupled to the global read precharge tracking control circuit and returns from a half way to the top of the SRAM forming a tracking dummy global read line that determines a completion of the precharge of the global read lines before the sense amplifiers start discharging the global read lines in the read cycle.

Pre-charge tracking of global read lines in high speed SRAM

In described embodiments, a memory circuit includes a static random access memory (SRAM) including N banks of memory cells, rows of M sense amplifiers, a controlled feedback latch storing a previous state of input data in a read cycle, a pull down select block coupled to the controlled feedback latch and the dummy sense amplifier, a dummy output latch coupled to the pull-down select block to store the read data, and a SRAM reset generation circuit coupled to the sense amplifier control circuits and the controlled feedback latch. The dummy output latch is a latch that is the same as a sense amplifier latch used in the local input/output circuit, thereby, no margin is involved between a reset of the sense amplifiers and the read data latched at the dummy output latch in the read cycle.

Memory having sense amplifier for output tracking by controlled feedback latch

A static memory system with multiple memory cell that, in response to a reset signal, simultaneously resets or clears a segment of the memory cells in the memory. Clearing the entire memory or a portion thereof is accomplished by sequencing though a subset of address bits while asserting the reset signal.

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Bengaluru, India

Vikash