Stmicroelectronics Gmbh

Integrated Device Technology, Inc.

Leaksentinel Inc.

Intergrated Device Technologies, Inc.

Vidyabhusan Gupta

Michael Shannon McCorquodale

Nader Fayyaz

Scott Michael Pernia

Gregory E Lowitz

Justin O'Day

Gordon Carichner

Adam Loren Freund

William Loesch

Nathaniel Charles Gaskin

William Eddie Armstrong

Disclosed herein are inexpensive, easy-to-install (do-it-yourself/DIY), non-invasive, independently powered automated devices, apparatuses, systems and methods for leak detection, prevention and mitigation, particularly fluid leak detection, prevention and mitigation, as well as water leak detection and water-supply shutoff of domestic and commercial pressurized water-supply networks.

Non-invasive, independently powered leak detector and valve shut-off apparatus

A reference signal generator includes an integrated circuit substrate having a semiconductor resonator therein. The resonator includes an inductor extending adjacent a first surface of the integrated circuit substrate. A vertically-stacked composite of at least first and second electrically insulating dielectric layers is provided on the integrated circuit substrate. The vertically-stacked composite covers a portion of the first surface, which extends opposite the inductor. A first electrically conductive shielding layer is provided on a portion of the second electrically insulating dielectric layer extending opposite the inductor. The first electrically conductive shielding layer may encapsulate exposed portions of the first and second electrically insulating dielectric layers. The shielding layer may operate as an electromagnetic shield between the inductor and an external structure, such as an integrated circuit package, and also shield against environmental contamination (e.g., external moisture penetration).

Semiconductor resonators with electromagnetic and environmental shielding and methods of forming same

Exemplary embodiments provide a reference signal generator having a reference or center frequency within a predetermined variance over variations in temperature within a specified range. An exemplary apparatus comprises a reference resonator to generate a first reference signal having a resonant frequency, with the reference resonator having a first temperature dependence; and a plurality of switchable circuits, with at least one switchable circuit providing a second temperature dependence opposing the first temperature dependence to maintain the resonant frequency within a predetermined variance over a temperature variation. A wide variety of switchable circuits are disclosed, including a transistor having an on resistance value greater than a nominal resistance, a resistor coupled to a transistor or other switch, and circuit comprising a first reactance coupled to a first switch, with a second reactance coupled to a resistance and a second switch coupled in series to the second reactance or to the resistance. Various coatings may also be applied to an integrated circuit embodiment, such as a silicone coating on a first surface and a metal layer on a second surface.

Clock, frequency reference, and other reference signal generator with frequency stability over temperature variation

There is disclosed an apparatus for designing and optimizing a memory for use in an embedded processing system. The apparatus comprises: 1) a simulation controller for simulating execution of a test program to be executed by the embedded processing system; 2) a memory access monitor for monitoring memory accesses to a simulated memory space during the simulated execution of the test program, wherein the memory access monitor generates memory usage statistical data associated with the monitored memory accesses; and 3) a memory optimization controller for comparing the memory usage statistical data and one or more predetermined design criteria associated with the embedded processing system and, in response to the comparison, determining at least one memory configuration capable of satisfying the one or more predetermined design criteria.

System and method for designing and optimizing the memory of an embedded processing system

There is disclosed a field programmable gate array (FPGA) that performs bit swapping functions in the interconnects rather than in the configurable logic blocks of the FPGA. The FPGA comprises: 1) a plurality of configurable logic blocks, including a first CLB having an N-bit output and a second CLB having an N-bit input; 2) a plurality of interconnects; 3) a plurality of interconnect switches for coupling ones of the plurality of interconnects to each other and to inputs and outputs of the plurality of configurable logic blocks; and 4) an interconnect switch controller for controlling the plurality of interconnect switches, wherein the interconnect switch controller in a first switch configuration causes a firsts group of interconnects coupled to the N-bit output of the first CLB to be coupled to a second group of interconnects coupled to the N-bit input of the second CLB according to a first connection mapping and wherein the interconnect switch controller in a second switch configuration causes the first group of interconnects to be coupled to the second group of interconnects according to a second connection mapping.

Method for implementing bit-swap functions in a field programmable gate array

There is disclosed a memory capable of storing a present value and at least one past value of a variable accessible by a first memory address. The memory comprises a memory block comprising R rows of memory cells and a row address decoder for decoding the first memory address. During a read operation, the row address decoder causes data to be retrieved from a row in which data stored to the first memory address was last written. During a write operation, the row address decoder causes data to be stored in a next-sequential row following the last-written row.

Memory decoder and method of operation

There is disclosed a field programmable gate array for use in an integrated processing system capable of testing other embedded circuit components in the integrated processing system. The field programmable gate array detects a trigger signal (such as a power reset) in the integrated processing system. In response to the trigger signal, the field programmable gate array receives first test program instructions from a first external source and executes the first test program instructions in order to test the other embedded circuit components in the integrated processing system. When testing of the other embedded circuit components is complete, the field programmable gate array loads its normal operating code and performs its normal functions.

Embedded field programmable gate array for performing built-in self test functions in a system on a chip and method of operation

There is disclosed a field programmable gate array (FPGA) that performs bit swapping functions in the interconnects rather than in the configurable logic blocks of the FPGA. The FPGA comprises: 1) a plurality of configurable logic blocks, including a first CLB having an N-bit output and a second CLB having an N-bit input; 2) a plurality of interconnects; 3) a plurality of interconnect switches for coupling ones of the plurality of interconnects to each other and to inputs and outputs of the plurality of configurable logic blocks; and 4) an interconnect switch controller for controlling the plurality of interconnect switches, wherein the interconnect switch controller in a first switch configuration causes a first group of interconnects coupled to the N-bit output of the first CLB to be coupled to a second group of interconnects coupled to the N-bit input of the second CLB according to a first connection mapping and wherein the interconnect switch controller in a second switch configuration causes the first group of interconnects to be coupled to the second group of interconnects according to a second connection mapping.

Interconnect circuitry for implementing bit-swap functions in a field programmable gate array and method of operation

There is disclosed a field programmable gate array that performs in the interconnect matrix selected Boolean logic functions, such as OR gates and NOR gates, normally performed in the configurable logic blocks of the FPGA. The field programmable gate array comprises: 1) a plurality of configurable logic blocks (CLBs); 2) a plurality of interconnects; 3) a plurality of interconnect switches for coupling ones of the plurality of interconnects to each other and to inputs and outputs of the plurality of configurable logic blocks; and 4) an interconnect switch controller for controlling the plurality of interconnect switches. The interconnect switch controller in a first switch configuration causes a first interconnect to be coupled to an output of a first CLB, causes a second interconnect to be coupled to an output of a second CLB, causes the first and second interconnects to be coupled to a third interconnect, and causes the third interconnect to be coupled to a pull-up device coupled to a power supply source of the field programmable gate array. The first, second and third interconnects and the pull-up device thereby form a two-input OR gate.

Interconnect circuitry for implementing logic functions in a field programmable gate array and method of operation

An apparatus for monitoring a load current drawn by an electrical circuit in a wire includes: 1) a Lorentz force MOS transistor having a first drain current (ID ) and a second drain current (ID ), wherein the Lorentz force MOS transistor is disposed proximate the wire carrying the load current and wherein a magnetic force generated by the load current increases a first current difference between the first drain current and a second drain current; 2) a current difference amplification circuit for detecting the first current difference between the first drain current and the second drain current and generating an amplified output signal; and 3) a current monitoring circuit coupled to the current difference amplification circuit capable of detecting and measuring the amplified output signal.

Growing community of inventors

Palo Alto, CA, United States of America

Vidyabhusan Gupta