Infineon Technologies Ag

Victor Popescu-Stroe

Bernhard Winkler

Matthias Boehm

Constantin Crisu

Dan-Ioan-Dumitru Stoica

Erhard Landgraf

Cesare Buffa

Emanuel Stoicescu

Alessandro Caspani

Dan-Alexandru Mocanu

Janis Weidenauer

Stefan Jahn

Uwe Fakesch

A capacitive sensor includes a first electrode structure; a second electrode structure that is counter to the first electrode structure, wherein the second electrode structure is movable relative to the first electrode structure and is capacitively coupled to the first electrode structure to form a capacitor having a capacitance that changes with a change in a distance between the first electrode structure and second electrode structure; a signal generator configured to apply an electrical signal at an input or at an output of the capacitor to induce a voltage transient response at the output of capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a time constant of the first voltage transient response and detecting the fault based on the time constant and based on whether the first electrical signal is the pull-in signal or the non-pull-in signal.

Detecting sensitivity faults in capacitive sensors by using pull-in functionality

A microphone device includes a number N of at least two serially coupled microphones forming a microphone chain. The microphones are configured to transmit data to a controller via the microphone chain. The microphone chain is configured to output time-multiplexed data transmitted by the microphones.

Microphone devices and methods for operating thereof

A capacitive sensor includes a first conductive structure; a second conductive structure movable relative to the first conductive structure in response to an external force acting thereon, wherein the first and the second conductive structures form a first capacitor having a first capacitance that changes with a change in a distance between the first conductive structure and second conductive structure, wherein the first capacitance is representative of the external force; and a diagnostic circuit configured to detect a first leakage current in the capacitive sensor by measuring an first electrical parameter that is affected by the first leakage current and comparing the measured first electrical parameter to a first predetermined error threshold, wherein the diagnostic circuit is further configured to generate a first error signal in response to the measured first electrical parameter being greater than the first predetermined error threshold.

Diagnosis of electrical failures in capacitive sensors

A method includes providing a first data channel configured for a transmission of acoustic data between a first microphone and a controller, providing a second data channel configured for a transmission of acoustic data between a second microphone and the controller, and transmitting non-acoustic data generated by the first microphone via the second data channel.

Methods for transmitting non-acoustic data between a microphone and a controller

Examples provide for an apparatus, method, and computer program for comparing the output of sensor cells in an arrangement of sensor cells in an area A, including a set of at least two measurement units. A measurement unit includes at least two sensor cells, wherein at least one sensor cell of at least one measurement unit includes a sensitive sensor cell, which is sensitive with respect to a measured quantity. The sensor cells are intermixed with each other. The apparatus further includes means for selecting output signals of sensor cells of the arrangement and means for determining a measured quantity or determining an intact sensor cell by comparing output signals of different measurement units.

Apparatus, method, and computer program for comparing the output of sensor cells

A filter circuit includes a first stage comprising a first infinite impulse response (IIR) filter; a third stage comprising a third IIR filter; and a second stage interposed between the first stage and the third stage, the second stage comprising a second IIR filter, where an output terminal of the first IIR filter is coupled to an input terminal of the second IIR filter, and an output terminal of the second IIR filter is coupled to an input terminal of the third IIR filter, where the second stage of the filter circuit is configured to operate in an acquisition mode when a transient is detected in an input signal to the first IIR filter, where during the acquisition mode, the second stage of the filter circuit is bypassed.

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Bucharest, Romania

Victor Popescu-Stroe