International Business Machines Corporation

Victor Marcello

Walter S Klara

Theodore William Kwap

Robert A Rasmussen

An on-chip apparatus for generation of timing signals for a large scale integrated (LSI) chip or semiconductor memory array is disclosed. This apparatus may be used both during the production testing of the memory and during normal functional operation. In the testing environment it allows use of much less expensive peripheral test equipment, while also providing for much greater accuracy in determination of whether or not the memory array meets its timing specification. Use during normal functional operation (subsequent to use in the test environment) provides for a guarantee of defect free operation.

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Stormville, NY, United States of America

Victor Marcello