Stmicroelectronics (crolles 2) Sas

Stmicroelectronics S.a.

Stmicroelectronics (rousset) Sas

Victor Malherbe

Gilles Gasiot

Philippe Roche

Sylvain Clerc

Fady Abouzeid

Severin Trochut

Olivier Le Neel

Capucine Lecat-Mathieu De Boissac

An X-ray detector includes a first circuit with an NPN-type bipolar transistor and a second circuit configured to compare a voltage at a terminal of the NPN-type bipolar transistor with a reference value substantially equal to a value of the terminal voltage which would occur when the first circuit has been exposed to a threshold quantity of X-rays.

X-ray detector

A first circuit includes a first chain of identical stages defining first and second delay lines. A second circuit includes a second chain of identical stages defining third and fourth delay lines. The stages of the second chain are identical to the stages of the first chain. A third circuit selectively couples one of the third delay line, the fourth delay line, or a first input of the third circuit to an input of the first circuit.

Measurement of the duration of a pulse

A radiation-hardened logic device includes a first n-channel transistor coupled by its main conducting nodes between an output node of a logic device and a supply voltage rail and a first p-channel transistor coupled by its main conducting nodes between the output node of the logic device and a ground voltage rail. The gates of the first n-channel and p-channel transistors are coupled to the output node.

Radiation-hardened CMOS logic device

Growing community of inventors

Grenoble, France

Victor Malherbe