Agilent Technologies, Inc.

Victor Johansen

Peter Mark O'Neill

Peter Maxwell

The present invention, in general, provides for a testing system and method for detecting defects within a circuit. A current signature of the quiescent current of the circuit is determined, and certain constant values are calculated based on the current signature using a linear iterative regression. A defect free state for the circuit associated with a minimum quiescent current (I ) is then determined. The I of the circuit for this state is measured, and a signal indicating the I at this state is used along with the aforementioned constant values to create upper and lower threshold values. Thereafter, signals indicating the value of I for a plurality of other states are compared to the upper and lower threshold values. The circuit is determined to be defective if the values of any of the signals is greater than the upper threshold value or is less than the lower threshold value.

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Santa Clara, CA, United States of America

Victor Johansen