Leco Corporation

Viatcheslav Artaev

Peter Markel Willis

Michael C Mason

Julie R Pitz

Mark Russell Wheeler

Anatoly N Verenchikov

Mikhail Yavor

Anatoli N Verentchikov

Joel C Mitchell

Mark A Wheeler

Kevin Lee McNitt

Georgy Y Tikhonov

Todd Richards

Lorne Fell

A method for ranking analytes includes the steps of analyzing an experimental analyte in a mass spectrometer. The method includes comparing the experimental analyte to a plurality of candidate analytes in a library hit list, and assigning a cumulative confidence score to each candidate analyte based on the steps of comparing the experimental analyte to the candidate analytes based on a library similarity score, comparing the experimental analyte to the candidate analytes based on of a presence of the most abundant isotope of a molecular ion and its mass, comparing the experimental analyte to the candidate analytes based on an abundance of fragment ions and a mass of the fragment ions, and, in some implementations, comparing the experimental analyte to the candidate analytes based on a retention index value. The method includes ranking the candidate analytes based on the cumulative confidence score of each candidate analyte.

Method for ranking library hits in mass spectrometry

An ion source includes a base, a first chamber, a second chamber and an extractor. The first chamber is disposed downstream of the base and defines a first internal volume having a first pressure. The second chamber is disposed downstream of the first chamber and defines a second internal volume having a second pressure. The second pressure is less than the first pressure. The repeller electrode is disposed within the first chamber. The extractor is disposed downstream of the second chamber.

Two-stage ion source comprising closed and open ion volumes

A multi-reflecting time-of-flight mass spectrometer (MR-TOF MS) includes an ion source, an orthogonal accelerator, and an ion mirror assembly. The ion source is capable of generating a beam of ions, and is arranged to accelerate the ions in a first direction along a first axis. The orthogonal accelerator is arranged to accelerate the ions in a second direction along a second axis. The second direction is orthogonal to the first direction. The ion mirror assembly includes a plurality of gridless planar mirrors and a plurality of electrodes. The plurality of electrodes are arranged to provide time-focusing of ions along a third axis substantially independent of ion energy and ion position.

Multi-reflecting time-of-flight mass spectrometer

An ion guide includes electrodes and an RF generator. The electrodes extend in a Z-axis that is straight or curved with a radius that is larger than a distance between the electrodes. The electrodes are made of carbon filled ceramic resistors, silicon carbide, or boron carbide to form bulk resistance with specific resistance between 1 and 1000 Ohm*cm. Conductive Z-edges are disposed on each electrode. An insulating coating is disposed on one side of each electrode and oriented away from an inner region of the ion guide surrounded by said electrodes. At least one conductive track per electrode is attached on a top side of the insulating coating. The conductive track is connected to one conductive electrode edge. The RF generator has at least two sets of secondary coils with DC supplies connected to central taps of the sets of secondary coils to provide at least four distinct signals.

Multi-reflecting mass spectrometer with high throughput

Method and embodiments are provided for tandem mass spectrometer designed for extremely large charge throughput up to 1E+10 ion/sec. In one operation mode, the initial ion flow with wide m/z range is time separated in a trap array. The array ejects ions with a narrower momentarily m/z range. Ion flow is collected and confined in a wide bore ion channel at a limited time spread. The ion flow with narrow m/z range is then analyzed in a multi-reflecting TOF at frequent and time-encoded operation of the orthogonal accelerator, thus forming multiple non overlapping spectral segments. In another mode, time separated ions are subjected to fragmentation for comprehensive, all-mass MS-MS analysis. The momentarily ion flow at MR-TOF entrance is characterized by lower spectral population which allows efficient decoding of overlapping spectra. Those modes are combined with conventional spectrometer operation to improve the dynamic range. To provide practical solution, there are proposed multiple novel components comprising trap arrays, wide bore confining channels, resistive multipole, so as long life TOF detector.

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial processing module, and a spectra processing module. The initial processing module is provided for processing the ion detection signals and for supplying processed signals to the spectra processing module. The spectra processing module generates spectra from the processed signals and supplies the generated spectra to an external processor for post-processing. The spectra processing module may include an ion statistics filter and/or a peak histogram filtering circuit.

Data acquisition system for a spectrometer using an ion statistics filter and/or a peak histogram filtering circuit

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial processing module, and a spectra processing module. The initial processing module is provided for processing the ion detection signals and for supplying processed signals to the spectra processing module. The spectra processing module generates spectra from the processed signals and supplies the generated spectra to an external processor for post-processing. The spectra processing module may include one or more of: a cross-spectra filter for filtering data in each spectra as a function of data in at least one prior spectra; a shaping filter for removing skew and shoulders from the processed signals; a sharpening filter for sharpening the peaks of the processed signals to effectively deconvolve and separate overlapping peaks; an ion statistics filter; and a peak histogram filtering circuit.

Data acquisition system for a spectrometer using various filters

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector and a processing circuit. The processing circuit may include an initial processing module and a spectra processing module. According to one embodiment, the spectra processing module generates stick spectra and supplies the stick spectra to an external processor. The stick spectra comprise a peak intensity, resolution, and a location in the spectra for each detected peak. The stick spectra may be generated in real time.

Data acquisition system for a spectrometer that generates stick spectra

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial/transient processing module, and a spectra processing module. The initial/transient processing module is provided for processing the ion detection signals and for supplying processed signals to the spectra processing module. The transient processing module may contiguously sample the ion detection signals at a rate of at least 1.5 GHz. The spectra processing module may generate spectra from the transients at a rate of at least 50 spectra per second. The initial processing module may be configured to have a sensitivity that is sufficient to detect a single ion received within one of over at least 100 transients and to detect and quantify a number of ions simultaneously striking said ion detector up to at least 10 simultaneously striking ions.

Data acquisition system for a spectrometer

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial processing module, and a spectra processing module. The initial processing module is provided for receiving, sampling, and processing ion detection signals received from the ion detector, and for supplying processed signals to the spectra processing module. The initial processing module includes a horizontal accumulation circuit that combines a fractional number of adjacent samples of the ion detection signals into bins. The number of adjacent samples to combine into bins may vary as a function of: (1) the time of arrival at the ion detector corresponding to that sample; (2) the mass corresponding to that sample; (3) the resolution corresponding to that sample; and/or (4) an operational mode of the spectrometer. The spectra processing module receives the processed signals and generates spectra.

Data acquisition system for a spectrometer using horizontal accumulation

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector and a processing circuit. The processing circuit may include an initial processing module and a spectra processing module. According to one embodiment, the spectra processing module generates stick spectra and supplies the stick spectra to an external processor. The stick spectra comprise a peak intensity, resolution, and a location in the spectra for each detected peak. The initial processing module may contiguously sample the ion detection signals at a rate matched to the capabilities of the ion detector (up to at least 1.5 GHz) over a full spectral range. The spectra processing module may receive the processed signals and generate spectra from the processed signals at a rate matched to the time response of the separation techniques (up to 200 spectra/second).

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St. Joseph, MI, United States of America

Viatcheslav Artaev