Arm Limited

Intel Corporation

Infineon Technologies Ag

Intel Mobile Communications Gmbh

Vianney Antoine Choserot

Yew Keong Chong

Andy Wangkun Chen

Sriram Thyagarajan

Gunther Lehmann

Christophe Chanussot

Nabil Badereddine

Loubna Hannati

Munish Kumar

Franz Ungar

Jean-Yves Larguier

Khushal Gelda

Marie Lafont Marazel

Various implementations described herein are related to a device having first datapath circuitry with input devices that receive data from a number of write ports and provide first data. The device may have second datapath circuitry with logic gates that receive the first data from the input devices and provide the first data based on a read bitline signal. The device may have third datapath circuitry with output devices that receive the first data from the logic gates and provide second data to a number of read ports. Also, the number of read ports is greater than the number of write ports.

Configurable scan chain architecture for multi-port memory

Various implementations described herein are related to a device having a storage node with a bitcell. The device may have a first stage that performs a first write based on an internal bitline signal, a first write wordline signal and a second write wordline signal. The first stage outputs the internal bitline signal. The device may have a second stage that receives the internal bitline signal and performs a second write of the internal bitline signal to the bitcell. The device may have a third stage with write wordline ports and write bitline ports. The third stage provides the internal bitline signal based on a selected write wordline signal from a write wordline port of the write wordline ports and based on a selected bitline signal based on a write bitline port of the write bitline ports.

Multi-port bitcell architecture

Various implementations described herein are directed to memory circuitry having an array of bitcells and bitlines coupled to columns of the bitcells. Also, column decoder circuitry may be coupled to the bitcells via the bitlines, and the column decoder circuitry may have read logic coupled to an output node. The column decoder circuitry may have select logic coupled between a voltage supply and the read logic. Enable signals may be used to activate the select logic to pass the voltage supply to the read logic, and the bitlines provide bitline signals that activate the read logic to pass the voltage supply from the select logic to the output node.

Control architecture for column decoder circuitry

Embodiments of design-for-test (DFT) apparatuses and related techniques are disclosed herein. In some embodiments, a DFT apparatus may include an SRAM cell, read/write (R/W) circuitry to provide a nominal word line (WL) voltage and a nominal BL voltage for application to the SRAM cell during accesses. The DFT apparatus may also include test circuitry having an activated state and a deactivated state. When the test circuitry is in the activated state, in some embodiments, the WL voltage and/or the BL voltage applied to the SRAM cell may be different from the nominal voltages provided by the R/W/decoder circuitry. The R/W/decoder circuitry may be operated to perform accesses to the SRAM cell while the test circuitry is in the activated state. Other embodiments may be disclosed and/or claimed.

Design-for-test apparatuses and techniques

Embodiments of design-for-test (DFT) apparatuses and related techniques are disclosed herein. In some embodiments, a DFT apparatus may include a static random access memory (SRAM) cell, read/write/decoder (R/W/decoder) circuitry to provide a nominal word line (WL) voltage and a nominal bit line (BL) voltage for application to the SRAM cell during accesses. The DFT apparatus may also include test circuitry having an activated state and a deactivated state. When the test circuitry is in the activated state, in some embodiments, the WL voltage and/or the BL voltage applied to the SRAM cell may be different from the nominal voltages provided by the R/W/decoder circuitry. The R/W/decoder circuitry may be operated to perform accesses to the SRAM cell while the test circuitry is in the activated state. Other embodiments may be disclosed and/or claimed.

For-test apparatuses and techniques

A ROM memory circuit is disclosed having at least one electrical line, at least one keeper circuit electrically connected to the at least one electrical line, the keeper circuit including a first transistor, a terminal of the first transistor is driven by a dedicated control signal, wherein the dedicated control signal is configured to keep the voltage of the at least one electrical line at a first voltage.

ROM device with keepers

Implementations are presented herein that relate to a fuse device, an integrated circuit including a fuse device, a method of implementing a fuse device and a method of programming a fuse device.

Fuse device

A read-out circuit is disclosed, where the circuit reads information out of a memory unit comprising two non-volatile memory cells. The cells have different programming states, and the memory information of the memory unit is given by the programming states of the two memory cells. The read-out circuit has a volatile signal memory, the inputs of which are connected to the read outputs of the memory cells.

Growing community of inventors

Antibes, France

Vianney Antoine Choserot