Centre National De La Recherche Scientifique

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Ecole Superieure De Physique Et Chimie Industrielles De La Ville De Paris

Ecole Superieure De Physique Et De Chimie Industrielles De La Ville De Paris

Paris Sciences Et Lettres

Viacheslav Mazlin

Mathias Fink

Albert Claude Boccara

Peng Xiao

According to one aspect, the invention relates to a system () for in vivo, full-field interference microscopy imaging of a scattering three-dimensional sample. It comprises a full-field OCT imaging system () for providing en face images of the sample, wherein said full-field OCT system comprises an interference device () with an object arm () intended to receive the sample and a reference arm () comprising an optical lens () and a first reflection surface (), and an acquisition device () configured to acquire a temporal succession of two-dimensional interferometric signals (I, I) resulting from interferences produced at each point of an imaging field; an OCT imaging system () for providing at the same times of acquisition of said two-dimensional interferometric signals, cross-sectional images of both the sample and a first reflection surface () of said full-field OCT imaging system (); a processing unit () configured to determine a plurality of en face images (X-Y) of a plurality of slices of the sample, each en face image being determined from at least two two-dimensional interferometric signals (I, I) having a given phase shift; determine from the cross-sectional images provided by the OCT imaging system () at the times of acquisition of each of said two two-dimensional interferometric signals (I, I) a depth (z) for each en face image (X-Y) of said plurality of slices; determine a 3D image of the sample from said plurality of en face images of said plurality of slices of the sample and depths.

Methods and systems for in vivo full-field interference microscopy imaging

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Villebon-Sur-Yvette, France

Viacheslav Mazlin