Electro Scientific Industries, Inc.

Vernon P Cooke

Douglas John Garcia

Naom Chaplik

Spencer Barrett

Mitsuaki Tani

Steven David Swendrowski

Jeffrey L Fish

Malcolm Vincent Hawkes

Martin J Twite, Iii

Peter A Cooke

Evart David Shealey

David M Ivancic

Chia-mu Chang

Michael C Steinmeyer

Hsang Wang

Martin S Voshell

An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.

System and method for improved testing of electronic devices

An improved method and apparatus for testing and sorting electro-optic devices by both electrical and optical properties at high speed is disclosed. Electro-optic devices, in particular light emitting diodes, are singulated by a singulation device and transferred to a linear track where they are tested for electrical and optical properties. The devices are then sorted into a large number of different bins depending upon the tested properties.

Testing and sorting system having a linear track and method of using the same

One or more concentric rings of component seats are rotatable about the rings' center. The seats are uniformly angularly spaced and the rings are incrementally rotated, the increment of rotation being the angular space between adjacent seats. The rings are inclined at an angle and a stream of components is poured onto the rings as they are rotating. Stationary fences adjacent to outboard sides of the seats, confine unseated components to tumble randomly, due to gravity, over empty seats passing through arcs of the rings' rotation paths. The random tumbling results in seated components. In the paths of the rotating rings are electrical contactors for coupling the components to a tester. Preferably there are five contactor stations to permit five different kinds of tests to be performed simultaneously. Tested components pass beneath an ejection manifold which defines a plurality of ejection holes which register with a set of seats each time the ring is rotated an increment. Ejection tubes are coupled to the ejection holes. The components are ejected from their seats by blasts of air from selectively actuated, respective pneumatic valves. Due to the blast of air and gravity, the ejected components travel down the tubes and are directed into sorting bins according to a tube routing plate. The stream of components can be selectively directed to each fence in response to a signal from a detector indicating that the fence is deprived of components. Sensors detect seated components that were not ejected by the ejection manifold.

Electrical circuit component handler

A stripe terminator (18) includes a carrier plate (20) for carrying a matrix of chips (12), a carrier plate shuttle (22) for longitudinally transporting the carrier plate (20) along guide rails (24), a paste platen (26), a doctor blade for spreading a paste layer (30) on platen (26) and a paste transfer assembly (32) for transferring paste from the platen (26) to the chips (12). The carrier plate (20) is reciprocated as the paste is applied to the chips (12) to form more uniform termination stripes (14) with wraparound segments (16). A novel ribbed paste tray (72) and contoured doctor blade (74) are also disclosed for bottom side paste application.

Method and apparatus for forming termination stripes

A plurality of electrical circuit components having capacitance, e.g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source that can produce an electrical potential selected from a wide range from low potential to high potential. For example the range of selectable potentials can be 1000 volts with a resolution of 1 volt. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller. Voltage sensors and current sensors measure accumulated charges and leakage current, respectively. The current sensor can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components, the processor being operatively coupled to, for controlling and receiving inputs from, the above elements. For example the processor is preferably coupled to the variable voltage source, the current controller, the voltage sensor, the current sensor, and a component discharge circuit, operatively coupled meaning that the processor controls.

Apparatus for stress testing capacitive components

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Escondido, CA, United States of America

Vernon P Cooke