Accenture Global Solutions Limited

Venugopal S Shenoy

Kishore P Durg

Mallika Fernandes

Jothi Gouthaman

Mahesh Venkataraman

Srinatha Sreedhara Mulugund

Kulkarni Girish

Sunder Ranganathan Nochilur

Chinmaya Ranjan Jena

Sivasankar Ramalingam

Matthias Rasking

Sunder Nochilur Ranganathan

Radhika Golden

Gopi Krishna Durbhaka

Ramchand R Bhambhani

Mahesh Venkata Raman

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for test cycle optimization using contextual association mapping. In one aspect, a method includes obtaining an artifact that includes a collection of reference items, where each reference item includes a sequence of words, generating candidate tags from each of the reference items based on the sequences of words in the reference items, selecting a subset of the candidate tags as context tags based on an amount that the candidate tags appear in the reference items, obtaining a sample item that includes a sequence of words, identifying a subset of the context tags in the sequence of words in the sample item, and classifying a subset of the reference items as contextually similar to the sample item based the context tags that were identified.

Test cycle optimization using contextual association mapping

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for a touchless testing platform employed to, for example, create automated testing scripts, sequence test cases, and implement defect solutions. In one aspect, a method includes receiving a log file and testing results generated from a code base for an application; processing the log file through a pattern-mining algorithm to determine a usage pattern of code modules within the code base; clustering defects from the testing results based on a respective functionality of the application reported within each of the defects; generating testing prioritizations for test cases for the application by assigning weightages to the test cases based on the clusters of defects and the usage pattern of the code modules within the code base; sequencing a set of the test cases based on the test prioritizations; and transmitting the sequence to a test execution engine.

Test prioritization and dynamic test case sequencing

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for test cycle optimization using contextual association mapping. In one aspect, a method includes obtaining an artefact that includes a collection of reference items, where each reference item includes a sequence of words, generating candidate tags from each of the reference items based on the sequences of words in the reference items, selecting a subset of the candidate tags as context tags based on an amount that the candidate tags appear in the reference items, obtaining a sample item that includes a sequence of words, identifying a subset of the context tags in the sequence of words in the sample item, and classifying a subset of the reference items as contextually similar to the sample item based the context tags that were identified.

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for a touchless testing platform employed to, for example, create automated testing scripts, sequence test cases, and implement determine defect solutions. In one aspect, a method includes the actions of receiving a log file that includes log records generated from a code base; processing the log file through a pattern mining algorithm to determine a usage pattern; generating a graphical representation based on an analysis of the usage pattern; processing the graphical representation through a machine learning algorithm to select a set of test cases from a plurality of test cases for the code base and to assign a priority value to each of the selected test cases; sequencing the set of test cases based on the priority values; and transmitting the sequenced set of test cases to a test execution engine.

Touchless testing platform

Growing community of inventors

Bengaluru, India

Venugopal S Shenoy