Texas Instruments Corporation

Venkateswara Reddy Pothireddy

Venkateswar Reddy Kowkutla

Bhavesh G Bhakta

Abhijit Kumar Das

Erkan Bilhan

Rejitha Nair

John Chrysostom Apostol

Kazunobu Shin

Siva Srinivas Kothamasu

Raghavendra Santhanagopal

Charles Gerlach

Wahed Abdul Mohammed

Ravi Teja Reddy

Rajagopal Kollengode Ananthanarayanan

A circuit includes a phase detector configured to produce a first up signal and a first down signal based on a difference between a reference clock and a feedback clock and a harmonic detector coupled to the phase detector, the harmonic detector configured to produce a second up signal based on the first up signal and whether the harmonic detector detects a harmonic lock between the reference clock and the feedback clock based on a first clock phase and a second clock phase. Additionally, the circuit includes a false lock detector coupled to the phase detector and to the harmonic detector, the false lock detector configured to produce a second down signal based on the first down signal and whether the false lock detector detects a false lock between the reference clock and the feedback clock based on a third clock phase and a fourth clock phase.

Method and circuit for DLL locking mechanism for wide range harmonic detection and false lock detection

An example system includes a controller having a first controller terminal, a second controller terminal, and a third controller terminal and digitally locked loop (DLL) circuitry having a first DLL terminal and a second DLL terminal, the first DLL terminal coupled to the first controller terminal. The system also includes first retimer circuitry having a first retimer terminal, and a second retimer terminal, and a third retimer terminal, the first retimer terminal coupled to the second DLL terminal and the second retimer terminal coupled to the second controller terminal and second retimer circuitry having a fourth retimer terminal, a fifth retimer terminal, and a sixth retimer terminal, the fourth retimer terminal coupled to the second DLL terminal and the fifth retimer terminal coupled to the third controller terminal.

Methods and apparatus to retime data using a programmable delay

In described examples, an integrated circuit (IC) includes an isolation, an input/output (IO), and a low power mode (LPM) control logic. The isolation includes a level shift with pull-down configured to weakly pull down the voltage of signals that travel through the isolation. The IO includes an input and a physical connector for coupling to a power management IC. The IO provides an asserted-low LPM enable signal to the physical connector in response to the IO input. An output of the LPM control logic is coupled via the isolation to the input of the IO. The LPM control logic provides a high voltage signal to the input of the IO as a default during power on reset (POR) of the IC. The pull-down pulls the LPM enable signal voltage to the asserted low voltage in response to a voltage of the LPM enable signal falling below a threshold.

Integrated circuit with low power mode management

Systems and circuits include an amplifier having an output; a switching circuit coupled to the output of the amplifier to provide a bias current to bias the amplifier; first current generating circuitry coupled to the switching circuit; and second current generating circuitry coupled to the output of the amplifier and to the switching circuit. In operation, the switching circuit provides the bias current, during a first time period, in response to a first signal generated by the first current generating circuitry, and provides the bias current, during a second time period, after the first time period, in response to a second signal generated by the second current generating circuitry.

Bandgap amplifier biasing and startup scheme

An example apparatus includes: digitally locked loop (DLL) circuitry coupled to a clock terminal and configured to generate a plurality of delayed clocks at a plurality of delayed clock terminals based on a reference clock of the clock terminal; first retimer circuitry coupled to the plurality of delayed clock terminals, a first data terminal, and a second data terminal, the first retimer circuitry configured to delay and serialize data of the first data terminal and the second data terminal using at least one of the delayed clocks of the plurality of delayed clock terminals; and second retimer circuitry coupled to the plurality of delayed clock terminals, a third data terminal, and a fourth data terminal, the second retimer circuitry configured to delay and serialize data of the third data terminal and the fourth data terminal.

In an example, a system includes an amplifier configured to produce a bandgap voltage reference. The system also includes a current source configured to provide a current to bias the amplifier. The system includes a switching circuit configured to receive a first current replica signal and a second current replica signal, the switching circuit further configured to cause the current source to provide the current to bias the amplifier based on either the first current replica signal or the second current replica signal.

A method and circuitry that enables an input/output pin (I/O) on a System on a Chip to function either as an analog or as a digital input/output without compromising the overall performance of the system, thus giving the automated test equipment full flexibility to maximize parallel testing for both analog and digital modules.

Dual function analog or digital input/output buffer

In a described example, an apparatus includes a driver circuit coupled to an output pad, the driver having a p-channel FET coupled between a positive peripheral voltage and the pad, and having a first gate terminal coupled to a first gate control signal, and an n-channel FET coupled between the pad and a ground terminal and having a second gate terminal coupled to a second gate control signal. A predriver circuit is coupled to receive a data signal for output to the pad and further coupled to output the first gate control signal; and the predriver circuit is coupled to output a supply voltage to the first gate control signal in a first mode, and to output a bias voltage less than the supply voltage to the first gate control signal in a second mode; and a bias circuit is coupled for outputting the bias voltage.

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Plano, TX, United States of America

Venkateswara Reddy Pothireddy