Emc IP Holding Company LLC

Venkat Allaka

Hung The Dinh

Vinod Kumar

Sabu K Syed

Manikandan Pammal Rathinavelu

Jatin Kamlesh Thakkar

Tousif Mohammed

Reddeppa Kollu

John Kenneth Maxi

Madhusudhana Reddy Chilipi

Chakradhar Kommana

Jyothi K R

Anu Bala Thakur

Abhishek Joshi

A method is disclosed including: obtaining one or more values of a system metric, the system metric being associated with a hardware resource of a computing device; detecting whether the system metric is approaching a threshold, the threshold being associated with a key performance indicator (KPI) of the computing device, the detecting being performed based on the obtained values of the system metric; calculating a predicted value of the system metric in response to detecting that the system metric is approaching the threshold, the predicted value of the system metric being calculated by using a linear predictor that is trained using unevenly-sampled training data; detecting whether the predicted value of the system metric exceeds the threshold; and reconfiguring the computing device to prevent the system metric from reaching the predicted value in response to detecting that the predicted value exceeds the threshold.

Time series forecasting classification

Growing community of inventors

Cedar Park, TX, United States of America

Venkat Allaka