Texas Instruments Corporation

Vaskar Sarkar

Prakash Narayanan

Nikita Naresh

Rajat Mehrotra

Prasanth Viswanathan Pillai

Swathi Gangasani

An example apparatus includes a buffer configured to, when enabled: obtain an input voltage; and provide the input voltage to a first boundary cell; and a second boundary cell configured to, when the apparatus is used in analog mode and a boundary scan occurs disable the buffer.

Methods and apparatus to implement a boundary scan for shared analog and digital pins

A built-in self-test (BIST) parallel memory test architecture for an integrated circuit, such as a system-on-a-chip (SoC), is disclosed. A BIST controller generates a test data pattern for memories of a common memory type, with this test data pattern forwarded to the memories, with pipeline delay stages inserted in the data path according to the operational speed of the memory in its normal operation. The expected data response of these memories, when read, and corresponding to this test data pattern is delayed for a group of memories by a local delay response generator shared by those memories. For example, the memories in the group of memories may be physically near one another. The local delay response generator delays the expected data response by a delay corresponding to the memory latency of those memories in the group, before applying the expected data response to local comparators associated with the memories in the group.

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Bengaluru, India

Vaskar Sarkar