Carl Zeiss Smt Gmbh

Leybold Gmbh

Valerie Derpmann

Martin Antoni

Michel Aliman

Hin Yiu Anthony Chung

Gennady Fedosenko

Alexander Laue

Leonid Gorkhover

Ruediger Reuter

Andreas Gorus

Theodore Lundquist

Rüdiger Reuter

A method for examining a gas by mass spectrometry includes: ionizing the gas for producing ions; and storing, exciting and detecting at least some of the produced ions in an FT ion trap. Producing and storing the ions in the FT ion trap and/or exciting the ions prior to the detection of the ions in the FT ion trap includes at least one selective IFT excitation, such as a SWIFT excitation, which is dependent on the mass-to-charge ratio of the ions. The disclosure further relates to a mass spectrometer. A mass spectrometer includes: an FT ion trap; and an excitation device for storing, exciting, and detecting ions in the FT ion trap.

Method for examining a gas by mass spectrometry and mass spectrometer

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Aalen, Germany

Valerie Derpmann