Integrated-x, Inc.

Valentin Macavei

Henry H Fung

Bruk Sahilu

Huy Ly

This disclosure provides a system and method for inspecting a component. The device can have a detector positioning system coupled to a detector and operable to move the detector within five degrees of freedom. The device can have an emitter positioning system operably coupled to the emitter and operable to move the emitter in three dimensions. The device can move the detector to a reference point above the component, the reference point being separated by a radius (&#x3c1;) on the applicate axis from an inspection point on the component. The controller can also receive at least one input from a display, and command the detector to a detector position within a spherical dome centered on the reference point based on the at least one input.

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Signal Hill, CA, United States of America

Valentin Macavei