Byk-gardner Gmbh

Uwe Sperling

Peter Schwarz

Konrad Lex

The invention relates to an apparatus for the investigation of surface properties with a housing, a light source which directs light through an opening in the housing onto a surface to be investigated, with a first detector device which is arranged inside at a first pre-set angle with respect to the light beam radiated onto the surface by the light source, with a second detector device which is arranged at a second pre-set angle with respect to the light beam radiated onto the surface by the light source and with a third detector device which is arranged inside the housing at a third pre-set angle with respect to the light beam radiated onto the surface by the light source. According to the invention the apparatus has at least two filter elements with optical properties which are different from each other which are arranged on a common carrier movable with respect to the light source, in such a way that each of these filter elements is optionally capable of being brought into a beam path between the light source and the surface.

Apparatus and method of investigating surface properties

Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.

Apparatus and method of investigating coatings with effect pigments

A method of determining optical properties of textured surfaces by irradiation of the surface to be investigated. At least part of the radiation irradiated onto the surface and reflected by the latter is detected by a detector device which permits a location-resolved evaluation of the radiation striking it. A first characteristic value from the radiation detected, characteristic of a texture of the surface is detected. A second characteristic value from the radiation detected, characteristic of a further optical property of the surface is detected. And, a result value is determined on the basis of the first characteristic value and the second characteristic value.

Method and device for determining properties of textured surfaces

A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.

Device for the investigation of textured surfaces

A colour measuring unit () comprising a radiation device () which emits light onto a surface () to be examined, wherein the radiation device () comprises at least one semiconductor-based light source (), and a radiation detector device () which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device () allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device () which determines at least one electrical parameter of the light source (), and also a processor device () which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device ().

Colour measuring unit

An apparatus () for analysing surface properties, comprising a first radiation device () which emits radiation directly onto a surface () to be analyzed, a first illumination device () for indirectly illuminating the surface () to be analyzed, a first radiation detector device () which receives at least part of the radiation thrown back from the surface () to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device () is provided which is at least partially illuminated by the first illumination device () and which transmits scattered radiation onto the surface () to be analyzed.

Apparatus for analysing surface properties with indirect illumination

A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to and reflected back from the surface, wherein the detector, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector are positioned, is variable and the radiation device and the detector are positioned in a space at least part of which exhibits light-reflecting properties.

Device for a goniometric examination of optical properties of surfaces

A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.

Apparatus for the determination of surface properties

A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Device for examining the optical properties of surfaces

A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

Method and apparatus for the evaluation of the local servers properties of surfaces

A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.

Apparatus for the examination of the properties of optical surfaces

A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Device for the examination of optical properties of surfaces

The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means and an output (display) means. Said first optical means comprises an illuminating means having at least one LED as its light source and serves the function of illuminating the measurement surface at a predetermined angle. Said second optical means is likewise directed at a predetermined angle to the measurement surface and receives the reflected light. A photo sensor of said second optical means emits an electrical measurement signal which is characteristic of said reflected light. The light emitted from the illuminating means is configured such that its spectral characteristic comprises blue, green and red spectral components in the visible light spectrum. A filter means is arranged in the path of radiation between the light source and the photo sensor and which changes the spectral characteristics of the incident light so as to approach a predetermined spectral distribution. The control and evaluation means control the measurement sequence and evaluate the reflected light, deriving therefrom at least one parameter which is characteristic of the surface.

Device and method for the determination of the quality of surfaces

A device for determining the properties of surfaces having at least one first radiation means having a least one radiation source which emits radiation, at least one radiation detector means which captures at least a portion of the radiation emmitting from the at least one radiation source and then diffused and/or reflected off a measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, an optical divider means having a specified thickness positioned in the optical path between the radiation means and the radiation detector means. The optical divider means includes at least one aperture extending at least in sections at a specified angle different from 0 degrees to the thickness of said optical divider means.

Device for determining the properties of surfaces

The present invention relates to a device for measuring transmission and reflection properties of objects and surfaces and a method for operating said device. The device is equipped with a housing, an optical measuring base unit and preferably a source of radiation for emitting radiation at a predetermined angle onto a measurement surface, as well as a detecting means for detecting the radiation reflected from said measurement surface. An elastic retaining means serves to elastically support the optical measuring base unit in the housing such that a touchdown surface for setting down said optical measuring base unit on the measurement surface is disposed external the housing and assumes a predetermined stressed position relative the housing in the unpositioned state.

Growing community of inventors

Geretsried, Germany

Uwe Sperling