Infineon Technologies Ag

Qimonda Ag

Uwe Mueller

Andreas Baenisch

Dirk Meyer

Werner Obermaier

Burkhard Ludwig

A method and a device can be used for checking the layout of an electronic circuit of a semiconductor component. For example, the method includes an automatic classification of cells in at least one layout into a cell database, and an automatic layout checker comparing the cell database to a layout to be checked.

Method and device for classifying cells in a layout into a same environment and their use for checking the layout of an electronic circuit

A method for correcting layout errors of a layout, for example layout errors of a layout of an electronic circuit, is disclosed. In order to be able to correct such layout errors with the least possible complexity, the layout is examined for the presence of layout errors with the aid of predetermined design rules, identical layout errors are combined in a respective error class, and all layout errors of an error class that are still present are automatically corrected without further checking in an identical manner as soon as the correction of a layout error of the respective error class that is used as an error representative has been performed.

Method for correcting layout errors

In a method for monitoring layout changes for semiconductor chips, a first group of error data is generated by comparing a first layout with wiring and layout rules. A second group of error data is generated by comparing a second layout with the wiring and layout rules, the second layout being generated from layout changes of the first layout. The first group of error data is compared to the second group of error data and only error data that are different in the first and second groups is output for evaluation.

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Munich, Germany

Uwe Mueller