Vistec Semiconductor Systems Gmbh

Uwe Goetz

Tillmann Ehrenberg

Guenter Schieferstein

A device for measuring positions of structures () on a substrate () is disclosed, wherein the device is enclosed by a climatic chamber (). An illumination and imaging means () is also arranged in the climatic chamber (). At least one loading station () for substrates is formed on an outer wall () of the climatic chamber (), wherein at least one transport means () for transporting the substrates is provided within the climatic chamber (). A means () for orienting the substrates () with respect to a coordinate system of the coordinate measuring machine () is provided, wherein the transport means () deposits the substrates () on the means () for orienting.

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Munich, Georgia

Uwe Goetz