Rohde and Schwarz Gmbh & Co. Kg

Uwe Bäder

Thomas Maucksch

Sandra Merkel

Andreas Roessler

Pirmin Seebacher

Christoph Freiherr Von Gagern

Thomas Braun

The present invention relates to a for testing user equipment. The test apparatus comprises an emulation module which is configured to emulate the functionality of a first user equipment and to establish a D2D link between the first user equipment and an externally arranged second user equipment which forms a user equipment under test. The test apparatus also comprises a test module which is configured to test at least one second user equipment after being connected to the emulated first user equipment of the emulation module via the established D2D communication link. The present invention further relates to a radio communication test apparatus, a method for testing user equipment and a computer program product.

Test apparatus, radio communication test apparatus, method for testing and computer program product

The invention related to a method and to a test device for analyzing a device communicating via a radio link. Said device comprises a plurality of antennas for communicating, together comprising an antenna arrangement. The device under test is first disposed in a first position relative to a radio field. A value of at least one piece of channel state information describing a quality of the antenna arrangement obtained via the return channel is determined in said relative position. A change in the relative position of the device under test relative to the radio field is subsequently performed. A second value of the at least on piece of channel state information is determined in said changed, new relative position.

Method and test instrument for analyzing a device communicating via a radio link

A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERwith a early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns bits of the output of the device are measured, thereby ne erroneous bits of the ns bits are detected. PDand/or PDare obtained, whereby PDis the worst possible likelihood distribution and PDis the best possible likelihood distribution containing the measured ne erroneous bits with the probablility D. The average numbers of erroneous bits NEand NEfor PDand PDare obtained. NEand NEare compared with NE=BER&#xd7;ns. If NEis higher than NEor NEis lower than NEthe test is stopped.

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Erding, Germany

Uwe Bäder