Infineon Technologies Ag

Siemens Aktiengesellschaft

Ute Kollmer

Roland Thewes

Carsten Linnenbank

Ulrich Schaper

Doris Schmitt-Landsiedel

Paul-Werner Von Basse

Michael Bollu

Andreas Luck, Deceased

By Inge Booken, Legal Representative

By Manfred Luck, Legal Representative

Stephan Sauter

The invention relates to a test circuit configuration. Every gate terminal of a transistor to be tested is coupled to a gate voltage source in such a manner that the gate voltage can be measured and adjusted individually on every gate terminal. The source terminal of every transistor to be tested can be coupled to the source voltage source in such a manner that the source voltage can be measured and adjusted individually on every source terminal.

Test circuit arrangement and method for testing a multiplicity of transistors

A circuit configuration for assessing capacitances in a matrix, which has a number of rows with at least one capacitance in at least one dimension, includes a test arm connected to first electrodes of each of the capacitances to be assessed and by which two different potentials can be applied to the first electrodes, a measurement arm connected to second electrodes of each of the capacitances to be assessed and that has a first measurement path and a second measurement path connected to a common potential. The first measurement path has an instrument for assessing the capacitances and the first and second measurement paths can be connected to the second electrodes. The circuit configuration has a drive device that connects each of the capacitances to be assessed individually to the two different potentials.

Circuit configuration and method for assessing capacitances in matrices

An apparatus and method for testing a plurality of electrical components that are coupled to one another. Further, an electrical selection unit, coupled to the electrical components to be tested, is provided for selecting at least one electrical component to be tested. A parasitic voltage drop in the testing circuit can be at least partially compensated using a control element coupled to the electrical components to be tested. The invention makes it possible, for testing of electrical components on a wafer over a large distance, i.e., several millimeters, to permit automated compensation of interference influences which occur as a result of the lines coupling or connecting the components to be tested.

Apparatus and method for testing a plurality of electrical components that are coupled to one another

In the pointer circuit, only one static memory (1) is respectively individually allocated to each output ( . . . , A.sub.n-1, A.sub.n, A.sub.n+1, . . . ), of which each respectively has a pair of mutually complementary memory terminals (Q, Q). The two terminals are in two stored logical states ('1,' '0') differing from one another. A memory terminal (Q) of each memory is connected with the output allocated to this memory. The memories are controlled by clock signals. This results in advantageous surface requirement and power loss low, as well as high speed.

Pointer circuit with low surface requirement high speed and low power

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Munich, Germany

Ute Kollmer