Ams Sensors Singapore Pte. Ltd.

Heptagon Photonics Pte. Ltd.

Uros Markovic

Nicola Spring

A method of manufacturing a plurality of optical elements includes providing a first wafer () having lower alignment features () arranged on a first surface of the substrate, providing a second wafer () comprising, on a replication side, a plurality of replication sections, each replication section defining a surface structure of one of the optical elements, the second wafer () further comprising upper alignment features () protruding, on the replication side, further than an outermost feature of the replication sections, depositing liquid droplets () on the first side of the first wafer (), and bringing the second wafer () and the first side of the first wafer () together, with liquid droplets () between the first wafer () and the second wafer (), the upper alignment features () contacting the liquid droplets () on the lower alignment features () on the first side of the first wafer (), and thereby causing the second wafer () to align with the first wafer () by capillary action.

Wafer alignment features

Techniques for controlling the flow of replication material (e.g., epoxy) during the formation of replicated optical elements include providing a transparent substrate () onto which the optical elements are to be replicated. The substrate () includes a structured UV curable shield () adhering to its surface. The UV curable shield (), in turn, has openings () that expose portions of the surface of the transparent substrate () for replication of the optical elements. During the replication process, excess replication material (A) may flow onto the UV curable shield (), which subsequently can be cured so as to facilitate the release and removal of the shield () along with the excess replication material (A).

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Zurich, Switzerland

Uros Markovic