Siemens Aktiengesellschaft

Bsh Bosch Und Siemens Hausgeraete Gmbh

Siced Electronics Development Gmbh & Co Kg

Bsh Bosch Und Siemens Hausgerate Gmbh

Ulrich Weinert

Heinz Mitlehner

Dietrich Stephani

Wolfgang Renz

Dirk Diehl

Gerd Griepentrog

Rudolf Röckelein

A linear drive including a stator and a rotor configured for linear reciprocal movement along an axis, with the stator having a magnetic-field guide core having a plurality of legs extending each with one foot substantially toward the rotor, with the rotor having a plurality of magnets disposed in a linear array along the direction of the axis, wherein at least one of a respective one of respective lengths of the magnets along the axis and the respective widths of the legs along the axis and the respective spacings of the legs along the axis are different such that force components of the magnets along the axis will substantially compensate each other when the linear drive is in a de-energized state.

Linear drive with a reduced axial force component, as well as a linear compressor and refrigerator

In a method and magnetic resonance system for generating a homogenous, radio-frequency excitation field in a spatial examination volume of the magnetic resonance system for a subject examination, the magnetic resonance system having a body coil comprised of N resonator segments or groups and a control and evaluation device for the separate activation of the individual resonator segments electromagnetically decoupled from one another, separate excitation of each individual resonator segment using defined excitation parameters ensue with an examination subject located in the magnetic resonance system and the respective segment-specific or group specific magnetic field distributions in the examination volume are determined. The segment-specific or group-specific magnetic field distributions are computationally superimposed to determine a overall field distribution in the examination volume. The homogeneity of the overall field distribution is evaluated using an evaluation algorithm and a change of one or more excitation parameters of one or more resonator segments or segment groups to compensate for a known field inhomogeneity is determined. The resonator segments or segment groups are excited with the determined parameter change to acquire an a diagnostic image of the subject.

Magnetic resonance apparatus and operating method for generating a homogenous RF field in the examination volume

J-FET having a first semiconductor region ( ), which comprises a first contact ( ) with a highly doped contact layer ( ) serving as a source disposed between two second contacts ( ) serving as a gate on its first surface ( ). The three contacts ( ) are each connected to a respective second semiconductor region ( ). The first and second semiconductor regions ( ) are of opposite conductivity types. The second semiconductor regions ( ) connected to the second contacts ( ) extend in the first semiconductor region ( ) below the second semiconductor region ( ) that is connected to the first contact ( ), with the result that the three second semiconductor regions ( ) at least partially overlap in a projection onto a horizontal plane and a channel region ( ) is formed between the three second semiconductor regions ( ) in the first semiconductor region ( ).

J-FET semiconductor configuration

A method for performing a short-circuit and overload disconnection with a semiconductor component includes the steps of providing a semiconductor component having a drain, a source and a gate. The semiconductor component has a gate-source voltage applied thereto, a current flowing therethrough, and a voltage dropping between the source and the drain. The gate-source voltage at the semiconductor component is adjusted, in dependence of the current flowing through the semiconductor component, such that, after charge carriers in the semiconductor component are depleted, the voltage dropping between the source and the drain assumes a highest possible value still uncritical for the semiconductor component and for a circuit to be disconnected. An algorithm is used for the step of adjusting the voltage dropping between the source and the drain. The apparatus for carrying out the method uses of a processor for ascertaining and processing measured values and for performing the short-circuit recognition and the disconnection.

Method and apparatus for performing a short-circuit and overload disconnection with a semiconductor component

A semiconductor configuration includes a first semiconductor region which has a predetermined conductivity type and a first surface. There is a contact region disposed on the first surface of the first semiconductor region. There is a second semiconductor region disposed within the first semiconductor region underneath the contact region which has a conductivity type opposite the predetermined conductivity type of the first semiconductor region. A first p-n junction having a first depletion zone is formed between the first semiconductor region and the second semiconductor region. The second semiconductor region extends further than the contact region in all directions parallel to the first surface of the first semiconductor region to form at least one lateral channel region with a bottom in the first semiconductor region. The at least one lateral channel region is bounded toward its bottom by the first depletion zone of the first p-n junction. In an on state of the semiconductor configuration, the at least one lateral channel region conducts an electric current from the contact region or to the contact region.

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Herzogenaurach, Germany

Ulrich Weinert