Carl Zeiss Jena Gmbh

Carl Zeiss Microimaging Gmbh

Other

European Molecular Biology Laboratory

Ulrich Meisel

Stefan Wilhelm

Joerg Steinert

Joerg Engel

Ralf Engelmann

Bernhard Zimmermann

Joerg-Michael Funk

Ulrich Simon

Gunter Moehler

Sebastian Tille

Matthias Reich

Mirko Liedtke

Thomas Mehner

Ralph Lange

Ernst H Stelzer

Ernst Hans Karl Stelzer

A process for confocal microscopyis disclosedin which laser light is coupled into a microscope beam path, directed successively with respect to time onto different locations of a specimen, and an image of the scanned plane is generated from the light reflected and emitted by the irradiated locations. A change in the spectral composition and in the intensity of lightisarecarried out during the deflection of the laser beam from location to location, while the deflection continues in an uninterrupted manner. In this way,so thatat least twoadjacentlocations of the specimenlocated next to one anotherare acted upon by light with different spectral characteristics and by laser radiation of different intensity. By periodically interrupting the coupling in of the laser light during the deflection of the microscope beam path,it is made possible thatonly selected portions of the image field are acted upon by the laser radiation. A laser scanning microscope for carrying out this process is also disclosed.A laser scanning microscope for carrying out this process is also disclosed.

Process and arrangement for confocal microscopy

Process for observing at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector. At an angle to the plane of the relative movement, a second scanner is moved and an image acquisition takes place by coupling the movement of the first and second scanners and a three-dimensional sampling movement being done by the illumination of the sample. The second scanner is coupled to the movement of the first scanner such that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Process for the observation of at least one sample region with a light raster microscope with linear sampling

An arrangement for the detection of the illumination radiation in a laser scanning microscope, wherein a portion of the illumination radiation is coupled out and detected at the main color splitter, wherein light transmitted through the main color splitter is advantageously detected and/or a portion of the illumination radiation is coupled out and detected before coupling into a light-conducting fiber and/or a portion of the illumination radiation is coupled out and detected at a beam splitter arranged downstream of a light-conducting fiber.

Arrangement for the detection of illumination radiation in a laser scanning microscope

Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

Process for the observation of at least one sample region with a light raster microscope

Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point

An arrangement in the illumination beam path of a laser scanning microscope, comprising a mirror which can be introduced into the beam path for coupling in at least one additional wavelength, and a method for the operation of a laser scanning microscope with a mirror which can be swiveled in rapidly for coupling at least one additional wavelength into the illumination beam path, wherein the swiveling process is synchronized with the illumination control by a control unit in such a way that at least one additional wavelength is coupled into the illumination beam path when the mirror is swiveled out.

Arrangement in the illumination beam path of a laser scanning microscope

A process for confocal microscopy is disclosed in which laser light is coupled into a microscope beam path, directed successively with respect to time onto different locations of a specimen, and an image of the scanned plane is generated from the light reflected and emitted by the irradiated locations. A change in the spectral composition and in the intensity of light is carried out during the deflection of the laser beam from location to location, while the deflection continues in an uninterrupted manner. In this way, at least two locations of the specimen located next to one another are acted upon by light with different spectral characteristics and by laser radiation of different intensity. By periodically interrupting the coupling in of the laser light during the deflection of the microscope beam path, it is made possible that only selected portions of the image field are acted upon by the laser radiation. A laser scanning microscope for carrying out this process is also disclosed.

Growing community of inventors

Jena, Germany

Ulrich Meisel