Agilent Technologies, Inc.

Adv Antest Corporation

Ulrich Knoch

Barbara Jean Duffner

Ronnie E Owens

Bert G Pihlstrom

Michael Richter

Gil Golov

Ronald D Larson

Thomas Henkel

A method for testing a device-under-test includes receiving, from at least one test channel circuit dedicated to communicate with an input/output pin of the device-under-test by means of at least one hardware resource, at least one logical control command describing a desired operation of the at least one hardware resource, and converting, by means of a resource controller, the at least one logical control command into at least one dedicated control command for the at least one hardware resource, wherein the at least one dedicated control command is adapted to be received by a physical implementation of the at least one hardware resource.

Method and apparatus for testing a device-under-test

A dual mode amplifier having single ended and differential ended modes of operation using only one set of output pads or terminals. The dual mode amplifier has two differential amplifiers, connected by coupling circuitry, each differential amplifier receiving a pair of differential input signals and having one output terminal. By activating and deactivating the coupling circuitry, the differential amplifiers can operate in two modes using the one set of output terminals. In the singled ended mode, the differential amplifiers operate independently, each converting the differential input signals to a singled ended output signal at their respective output terminals. In the differential mode, the differential amplifiers operate together to provide a pair of differential output signals at the output terminals based upon the pair of input signals.

Selectable single mode or differential mode operation in a single amplifier

Growing community of inventors

Herrenberg, Germany

Ulrich Knoch