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Gsf-Forschungszentrum F&uuml;r Umwelt Und Gesundheit Gmbh

Bruker-Franzen Analytik Gmbh

Gsf-Forschaungszenfrum F&uuml;r Umwelt Und Gesundheit Gmbh

Ulrich Boesl

Antonius Kettrup

Ralf Zimmermann

Egmont Rohwer

Edward W Schlag

Ralph Dorfner

Hans J&ouml;rg Heger

Ralf Dorfner

Klaus Walter

Klaus Hafner

Rainer Weinkauf

Jorg Heger

Hans J Neusser

Fabian M&uuml;hlberger

In an arrangement for producing a directional and cooled gas jet in an ion source with a gas inlet or a UV/fluorescence detection cell including a gas inlet, wherein a capillary extends with one end into the interior of the ion source which is evacuated, the one end is provided with a nozzle for discharging a gas sample into the ion source while being subjected to adiabatic cooling and the width of the nozzle opening is at most 40% of the inner diameter of the capillary and the capillary is heatable for preventing condensation of gas sample components in the nozzle.

Gas inlet for reducing a directional and cooled gas jet

In a method and apparatus for detecting compounds in a gas stream, the gas stream with the compounds to be detected is conducted into an ionization chamber of a mass spectrometer where the gas stream is subjected in the ion chamber in a pulsed manner alternately to UV laser pulses and to vacuum ultraviolet VUV laser pulses and the ions generated thereby are directed into the mass spectrometer for detection therein to determine the compounds in the gas stream.

Method and device for detecting compounds in a gas stream

In a gas inlet structure for an ion source, including a capillary for the admission of a sample gas, which capillary is disposed in a guide tube for discharging a sample gas into the guide tube, the guide tube has an open end disposed in the ion source. The guide tube includes a valve for the pulsed admission of a carrier gas to the guide tube. The guide tube, the valve and the capillary are supported in a sealed support housing from which the guide tube with the capillary disposed therein projects into the ion source for supplying thereto the sample gas in a pulsed manner.

Gas inlet for an ion source

In a method for producing a directed gas jet wherein a guided sample gas beam is generated and an auxiliary gas beam is generated and directed and guided in the same direction as, but separated from, the sample gas beam, a pulsed carrier gas stream is generated and combined with the sample gas beam such that the sample gas beam is separated into spaced pulses which are embedded between the axially spaced pulses of the carrier gas beam and the carrier gas beam with the sample gas beam embedded therein is combined with the auxiliary gas beam such that the carrier and sample gas beam is radially enveloped by the auxiliary gas beam to from the directed gas jet of a carrier and sample gas pulses enveloped in the auxiliary gas beam.

Method and device for producing a directed gas jet

In an MS-MS time-of-flight mass spectrometer, a space focus of the ion source is defined by correction of the second order. If the geometrical and electric values of the ion source are suitably selected, the space focus may be such as to permit very good primary mass resolution when suitable secondary interaction methods are used. The secondary interaction at the space focus may be effected (a) by a focused, pulsed laser ray or other pulsed interaction methods that can be focused. (b) by a wire mesh consisting of very fine 'line combs' engaging each other, to which voltage pulses can be applied, (c) by a combination of a) and/or b) with an electrostatically high, primary, fieldless drift path. The MS-MS time-of-flight mass spectrometer is operated using a reflector comprising a movable reflector end plate with adjustable potential, which enables primary ions to be eliminated from the spectrum without any loss in mass resolution. By tuning the reflector fields in a suitable manner, and suitable selection of an observation window in the time-of-flight spectrum, it is possible to measure a secondary mass spectrum generated at the space focus.

MS-MS time-of-flight mass spectrometer

A process for determining molecular spectra in unseparated mixtures, in particular unseparated isotopic mixtures, which comprises allowing said mixture to successively flow through a photoreactor which is irradiated by an adjustable-wavelength laser and then through a mass spectrometer wherein the concentration of particles of specified mass is determined by variation of the wavelength of the laser or variation of the mass setting of the mass spectrometer in such a manner that a two-dimensional spectrum results having the parameters of wavelength and mass.

Process and apparatus for determining molecule spectra

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Landshut, Germany

Ulrich Boesl