Dr. Johannes Heidenhain Gmbh

Johannes Heidenhain Gmbh

Ulrich Benner

Wolfgang Holzapfel

Elmar Josef Mayer

Walter Huber

Michael Hermann

Jan Braasch

Karsten Sändig

Martin Seichter

Christoph Lingk

Tarek Nutzinger

Robert Bernhard

Johannes Haunreiter

Johannes Trautner

Volker Höfer

Gabriele Ehgartner

Daniel Krempke

Thomas Schürmann

Völker Hofer

An optical position-measuring device includes a scale and a scanning unit. The scale is connected to a first object, extends along a measurement direction and includes a first track having an incremental measuring graduation, and a second track having an absolute measuring graduation. The scanning unit is connected to a second object and includes a light source, a detector having an absolute detector arrangement configured to detect an aperiodic light pattern transmitted from the absolute measuring graduation onto a detection plane and an incremental detector arrangement configured to detect a periodic light pattern transmitted from the incremental measuring graduation onto a detection plane, and a fiber-optic plate arranged as a continuous component in front of the absolute detector arrangement and the incremental detector arrangement, wherein both absolute track information and incremental track information in the respective detection planes are transmitted via the fiber-optic plate in this manner.

Optical position-measuring device

An optical position-measuring device for determining the position of a first object relative to a second object movable relative to the first object along a measurement direction includes a scale with a measuring graduation connected to the first object and extending along the measurement direction. A scanner is connected to the second object and includes a fiber-optic array including optical fibers. The fiber-optic array is configured as a fiber-optic plate having an image-input face facing the scale and an image-output face facing the detector array. The fiber-optic array transmits a light pattern into a detection plane of the detector array. An interstitial medium is disposed between the image-output face of the fiber-optic plate and the detector array to ensure that an amount of deflection that the beams exiting the image-output face undergo on a path to the detector array is smaller than in a case without the interstitial medium.

A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.

Rotary position measuring instrument

A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.

Position-measuring device

A position measuring device including a code having a sequence of code elements of equal width B that is disposed in a measurement direction and includes a first property and a second property. The sequence of codes elements includes a first set of code elements having the first property and a second set of code elements having the second property, wherein the first and second sets of code elements are each being disposed aperiodically. The position measuring device further including a scanning unit having a plurality of detectors for scanning the code and obtaining scanning signals, wherein a code word defining an absolute position is defined from the scanning signals. The position measuring device including an arrangement for forming an incremental signal from the scanning signals, wherein the arrangement includes a converter device and a collection device arranged downstream of the converter device and wherein the collection device forms respective intermittently periodic partial signals from the scanning signals derived from scanning positions in a spacing matrix.

Position measuring device

A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.

Optical position measuring device

A scanning unit for an optical position-measuring device includes a semiconductor light source and at least one downstream reflector element that has a defined optical effect on the beams of rays emitted by the semiconductor light source. The optically active surface of the reflector element is arranged in subregions to be reflection-preventive such that no beams of rays are reflected back from the reflector element into the semiconductor light source.

Scanning unit for an optical position-measuring device

In a position-measuring device for acquiring the relative position of a scanning unit and a reflection measuring graduation movable relative thereto in at least one measuring direction, the scanning unit includes a light source and a detector arrangement in a detection plane. In a first variant of the scanning unit, at least one optical reflector element is positioned in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between a virtual light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and the detector arrangement/detection plane on the other hand are identical. In a second variant, in the scanning unit at least one optical transmission element is disposed in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between the light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and a detector arrangement in a virtual detection plane on the other hand are identical.

A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.

Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit

A scanning unit for a position measuring instrument for optical scanning of a measuring graduation. The scanning unit includes a light source that emits light in a direction towards a measuring graduation that generates modified light from the emitted light. A detector that receives the modified light. A lens array, disposed upstream of the detector and including a plurality of optical lenses, that generates a defined image of a region of the measuring graduation, scanned by the emitted light, on the detector, wherein an image magnification of the lens array is greater than 0 and less than or equal to 2.

Scanning unit for a position measuring instrument for optical scanning of a object measuring graduation

A position measuring system that includes a scale having a measuring graduation extending along a first line and a scanning device. The scanning device includes a light source that transmits light beams that scan the measuring graduation, wherein the measuring graduation generates modified light from the transmitted light beams and a detector unit that receives the modified light from the measuring graduation. A lens arrangement, arranged between the scale and the detector unit, the lens arrangement generating a defined image of the measuring graduation on the, detector unit, wherein the defined image extends along a second line, whose curvature is different from a curvature of the first line.

Position measuring system

An interferential position measuring arrangement including a light source, which emits a beam of rays and an optical element, which converts the beam of rays emitted by the light source into an incoming beam of rays. A scale grating which splits the incoming beam of rays into a first partial beam of rays and a second partial beam of rays. A first scanning grating that causes splitting of the first partial beam of rays and a second scanning grating that causes splitting of the second partial beam of rays, wherein a periodically modulated interferential fringe pattern with definite spatial interferential fringe pattern period results in a detection plane. A detection arrangement which causes splitting of light entering through the detection arrangement into at least three different spatial directions and optoelectronic detector elements arranged in the at least three spatial directions for detecting phase-shifted scanning signal.

Interferential position measuring arrangement

An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, A(r) or the mutual distance between adjoining lenses of said lens array defined by the equation:wherein

A position measuring system that includes a scale having a first track with successive partial areas of differing reflectivity and a second track with successive partial areas of differing reflectivity. A scanning unit which moves relative to the scale in a measuring direction so that a first position dependent scanning signal and a second position dependent scanning signal are generated by scanning the first track and the second track by the scanning unit. The first position dependent scanning signal and the second position dependent scanning signals have a different pitch behavior in case of a pitch tilt of either the scanning unit or the scale to the effect, that in that case the first position dependent scanning signal indicates an erroneous position, while the second position dependent scanning signal continues to show a correct position. The scanning unit has a structure such that a third position dependent scanning signal is generated from the first track and has a different pitch behavior than the first position measuring scanning signal generated from the first track.

Position measuring system and method for operating a position measuring system

A scale which is suitable for an absolute position determination, the scale includes a track which extends in at least one measuring direction and in which graduation areas of identical width and different optical properties are alternatingly arranged. At least first, second and third graduation areas with different optical properties that are arranged in the track, wherein a first logical signal is unequivocally assigned to a first combination of two successive different graduation areas, and a second logical signal is unequivocally assigned to a second combination of two successive different graduation areas, and wherein the first and second combinations differ from each other.

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Trostberg, Germany

Ulrich Benner