Infineon Technologies Ag

Klippel Gmbh

Ulf Seidel

Wolfgang J Klippel

According to an embodiment, a processing circuit includes: a data acquisition circuit configured to acquire process data and measurement data of a processing arrangement, the process data including a plurality of process event data in accordance with a plurality of process events and the measurement data including a plurality of measurement event data in accordance with a plurality of measurement events; a data merging circuit configured to provide state information, the state information representing a status of the processing arrangement, and accuracy information representing an accuracy of the state information; wherein the data merging circuit is further configured to update the state information based on the acquired process event data, wherein the accuracy of the state information is decreased, and, independently from updating the state information, to downdate the state information based on the acquired measurement event data, wherein the accuracy of the state information is increased.

Process control circuit and method for controlling a processing arrangement

The invention relates to an arrangement for measuring and assessing properties of a system () which transfers an electrical, mechanical or acoustical signal or converts an excitation signal x into another signal y. An error system () models the transfer behavior of the system, estimates a desired output signal y', and generates an error signal e which reveals the excess distortion and disturbances of the output signal y at any time instant t, and can reveal peak values of transient distortion having low power which might otherwise be masked by noise and regular distortion. The error signal is supplied to an assessment system (), where convenient distortion measures are calculated and the distortion is displayed versus properties of the signal (e.g., instantaneous frequency and amplitude). The assessment system may also generate a control output () to modify signal x to ensure an optimal excitation of the system.

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Dresden, Germany

Ulf Seidel