Mpi Corporation

Tzu-Yang Chen

Che-Wei Lin

Chen-Rui Wu

Tsung-Yi Chen

Chin-Yi Lin

Chung-Tse Lee

Tien-Chia Li

Shang-Jung Hsieh

Chia-Yuan Kuo

Sheng-Yu Lin

Ming-Ta Hsu

Chia-Ju Wei

Probe for testing device under test

A probe head includes upper and lower die units, and a linear probe inserted therethrough and thereby defined with tail, body and head portions. A first bottom surface of the upper die unit and a second top surface of the lower die unit face each other, thereby defining an inner space wherein the body portion is located and includes a plurality of sections each having front width larger than or equal to back width, including a narrowest section whose upper and lower ends have a distance from the first bottom surface and the second top surface respectively. The head and tail portions are offset from each other along two horizontal axes and the body portion is thereby curved. The present invention is favorable in dynamic behavior control of the linear probe which is easy in manufacturing, lower in cost and has more variety in material.

Probe head with linear probe

A positioner and a probe head of a probe card are provided. The positioner has a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion. The first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and are communicated to the main opening. A stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

Positioner of probe card and probe head of probe card

Growing community of inventors

Hsinchu County, Taiwan

Tzu-Yang Chen