Metal Industries Research & Development Centre

Eys3d Microelectronics, Co.

Tzu-Hung Chen

Wen-Chieh Wu

Zhi-Wen Fan

Chun-Wei Chen

Yu-En Huang

The present invention is a probe forming device, the probe forming device comprises a spinning shaft, a first adjusting structure, a second adjusting structure, an electrolyte conveying member and a power supply. One of the holding member of the spinning shaft holds a workpiece, and a driving member drives the workpiece to move and abut the first adjusting structure and the second modulating structure. The electrolyte conveying member conveys an electrolyte to the workpiece, the first adjusting structure and the second adjusting structure, and is electrically connected. At least one positive end of the power supply is connected to the workpiece or the spinning shaft, and at least one negative end is connected to the first adjusting structure and the second modulating structure.

Probe forming device

The present application discloses a method for processing probe. Firstly, a clamping member of a rotation shaft is clamped with a workpiece, and then the workpiece is moved to a processed area by the rotation shaft. The workpiece is rotated by the rotation shaft, and an electrochemical process of the workpiece is performed under the rotation of the shaft and an electrolyte sprayed between the workpiece and the polished module. During the performing of the electrochemical process, it can be that the rotation shaft is moved a processing distance or the included angle of the polish module is changed, for a probe being accomplished from the workpiece. Thereby, the abrasion of the polish module is lower and the performance for processing the probe under the electrochemical process.

Method for processing probe

A device capable of correcting wrong normal vectors of an original three-dimensional scan result includes a normal vector generation unit and a correction unit, wherein the original three-dimensional scan result corresponds to an object. The normal vector generation unit is used for generating a normal vector corresponding to each point of the original three-dimensional scan result according to the each point of the original three-dimensional scan result and a plurality of predetermined points of the original three-dimensional scan result adjacent to the each point of the original three-dimensional scan result. The correction unit is coupled to the normal vector generation unit for determining an inner region of the original three-dimensional scan result, and reversing a normal vector corresponding to a point of the original three-dimensional scan result when the normal vector corresponding to the point is toward the inner region of the original three-dimensional scan result.

Growing community of inventors

Kaohsiung, Taiwan

Tzu-Hung Chen