Siliconware Precision Industries Co., Ltd.

Tzong-Dar Her

Chien-Ping Huang

Chih-Chin Liao

Chi-Chuan Wu

Randy H Y Lo

April Chen

Han-Ping Pu

Kevin Chiang

Cheng-Shiu Hsiao

Ya-Hui Huang

A super low profile package with stacked dies comprises a substrate, a heat spreader, a first die, a second die, a molding compound, and a number of solder balls. The substrate has a cavity, a top surface and a bottom surface opposite to the top surface. The heat spreader is connected to the bottom surface of the substrate, and a portion of the heat spreader opposite to the cavity serves as a die pad. The first die seated in the cavity is attached to the die pad while the second die seated in the cavity is attached to the first die, and both dies are wire-bonded to the substrate for electrical connection. The molding compound fills the cavity and encapsulates the first die, the second die, the heat spreader, and part of the bottom surface of the substrate. Numerous solder balls are attached to the bottom surface of the substrate. The benefits resulting from the package of the invention include a reduction of profile, a simple manufacturing process, and a low prime cost.

Super low profile package with stacked dies

A super low profile package with high efficiency of heat dissipation comprises the substrate, the heat sink, the die, the wires and the plastic mold. The heat sink adheres to the ground ring by the extending part of the heat sink, and the first surface of the die adheres to the heat sink. In addition, the die is connected to the substrate by the wires, and the plastic mold encapsulates the die, the heat sink and the wires. The chip package according to the invention possesses the small size and high efficiency of heat dissipation; besides, it also decreases the production cost for eliminating the conventional procedures of taping and de-taping.

Super low profile package with high efficiency of heat dissipation

A structure of a multi chip module package having stacked chips, having at least a substrate, a main chip, a plurality of chip sets, a plurality of spacers, a plurality of glue layers, a plurality of wires, and a mold compound. The substrate has a front surface and a back surface opposite to the front surface. A plurality of chips are stacked in the form of laminate on the front surface of the substrate to form a plurality of chip sets, which are located next to the main chip. A plurality of spacers are arranged between each two adjacent chips. The connection between the spacers, the main chip, the chips, and the substrate are achieved by a plurality of glue layers. A plurality of wires are used to electrically connect the chips and the main chip to the substrate. Finally, the front surface of the substrate, the main chip, the spacers, the chips, and the glue layers are encapsulated with a mold compound to accomplish the package.

Structure of a multi chip module having stacked chips

A stacked-die package structure comprises a carrier, dies, spacers, adhesive layers, conductive lines, a mold compound, and solder balls. The carrier has an upper surface and a back surface opposite to the upper surface. The dies substantially having the same sizes are stacked one by one on the upper surface of the carrier, and a number of bonding pads are located around each die. The spacers are located between two adjacent dies. Adhesive layers located between the spacers, the dies, and the carrier for adhering layers therebetween. The conducting lines are respectively electrically connected between each of the bonding pads of the dies and the carrier. And the mold compound is formed over the upper surface of the carrier, for encapsulating the spacers, the dies and the adhesive layers. A substrate with solder balls or a lead frame having pins is suitable for serving as the carrier.

Stacked-die package structure

A quad flat non-leaded package comprises: a die pad having a first upper surface and a corresponding first lower surface thereon a plurality of interlacing slots are formed, each of the interlacing slots extending to the edges of the die pad to form a plurality of island-like blocks; a plurality of leads disposed at the periphery of the die pad, wherein each of the leads has respectively a second upper surface and a corresponding second lower surface coplanar to the surface of the island-like blocks; a chip having an active surface and a corresponding back surface adhered onto the first upper surface of the die pad; and a molding compound encapsulating the chip, the second upper surface, the first upper surface and the interlacing slots while exposing the surface of the island-like blocks and the second lower surface of the leads.

Quad flat non-leaded package and leadframe for use in a quad flat non-leaded package

A heat dissipation ball grid array package includes the following elements. A plurality of first thermal ball pads is formed on the underside of a substrate in the area covered by chip. A plurality of second thermal ball pads or a heat dissipation ring is formed outside the first thermal ball pads. A plurality of signal ball pads is formed outside the second thermal ball pads or the heat dissipation ring. The second thermal ball pads or heat dissipation ring is connected to the first thermal ball pads by conductive trace lines. A plurality of first thermal balls is attached to the respective first thermal ball pads. The signal balls are attached to the respective signal ball pads. The first thermal balls and the signal balls are in contact with corresponding contact points on a printed circuit board. A plurality of second thermal balls is attached to the respective second thermal ball pads or the surface of the heat dissipation ring.

Heat dissipation ball grid array package

The present invention is a method for identifying defective elements in array molding of semiconductor packaging for mini BGA packaging substrate which comprises a circuit zone and a periphery zone. The method of the present invention is first to form a plurality of package sites disposed in array in the circuit zone, and to form a plurality of marks in a periphery zone. When a defective element is found in the package sites, a symbol is put at the mark or an electronic file is employed to record the location of the defective element, thereby, the defective element in the package sites of the molding array in the circuit zone can be identified.

Method for identifying defective elements in array molding of semiconductor packaging

A multi-chip packaging substrate having a non-sticking test structure consists of a plurality of non-sticking test spots formed in the periphery zone outside the chip-packaging zone of a multi-chip packaging substrate. Each of these non-sticking test spots is electrically connected to an adjacent one of a plurality of chip pads respectively in the chip packaging zone through a plurality of conductive traces while there are no electrical connections connected one another among the chip pads.

Multi-chip packaging having non-sticking test structure

A crack-preventive substrate for fabricating a solder mask in a device site region includes a substrate, which has a top surface and a bottom surface, and a solder mask layer. The substrate is divided into a device site region and a periphery region. The solder mask layer, disposed on the top surface and bottom surface of the substrate, forms a bare area on the top surface and bottom surface of the substrate by exposing a portion of the substrate on the top surface and bottom surface of the substrate. And the bare areas divide the solder mask layer into a &ldquo;device site region solder mask layer&rdquo; and a &ldquo;periphery region solder mask layer&rdquo;. As a result, the crack lines generated on the solder mask layer at the perimeter of the substrate will not develop toward the solder mask in the device site region.

Crack-preventive substrate and process for fabricating solder mask

A tiny ball grid array package based on a substrate. The substrate has at least an insulation layer and two copper foils laminated together. A hole is formed near the center of the substrate. A second one of the copper foils is patterned into multiple conductive traces formed on a surface of the substrate, while a first one of the copper foils has a surface partly exposed. The first copper foil is coupled with the conductive traces by vias, meanwhile, the first copper foil is grounded to form a ground plane, so as to improve the electrically properties and the heat dissipation efficiency. Bonding pads are formed in one surface of a chip. This surface is thermal-conductively connected to the grounded level, and the bonding pads are located in the hole. The bonding pads are electrically connected to a near end of a conductive trace by a conductive wire, and solder balls are attached at a far end of the conductive trace. A molding material fills the hole and covers a surrounding area of the hole to protect the bonding pads, the conductive wire, and the conductive traces, so as to cover ajunction area of the chip and the ground plane.

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Taichung, Taiwan

Tzong-Dar Her