General Electric Company

Tymm Bradner Schumaker

John Ruediger Mader Viertl

Pavel Alexeyevich Fomitchov

Elena Rozier

Pamela King Benicewicz

An in-situ laser plasma spectroscopy (LPS) system for automated near real-time elemental depth profiling of a target including: an optical source configured to generate an optical beam, wherein the optical beam is pulsed; an optical probe system configured to deliver the optical beam from the optical source to a surface of a target to generate an ablation plasma; a time resolved spectral detection system configured to generate time resolved spectral data from emission signals from the ablation plasma; and a data acquisition and processing system configured to acquire the time resolved spectral data to determine, in combination with predetermined calibration data, an absolute elemental concentration as a function of depth in near real-time.

Laser plasma spectroscopy apparatus and method for in situ depth profiling

A method for determining a useful life applied to a coating on a surface of a component coupled to a rotatable member of a rotary machine. The method includes directing a laser across a surface of the component while the rotatable member remains coupled within an assembled rotary machine and measuring radiation emitted from the surface of the component.

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Saratoga Springs, NY, United States of America

Tymm Bradner Schumaker