Analog Devices,inc.

Tyler Ray

Miguel A Chavez

Christopher M Hanna

Neal Tait Kurfiss

Joshua Berlin

Nicholas J Jakse

Systems and methods for optically measuring displacement of an element include an emitter for emitting an optical signal, a first detector for detecting reflections of the optical signal from the element, a second detector for detecting reflections of the optical signal from a raised cover structure, a processor for receiving the detected reflections from the first and second detectors and removing distortions in the detected reflections from the first detector using the detected reflections from the second detector.

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Hanover, NH, United States of America

Tyler Ray