Nec Corporation

Tutomu Ichimura

Masaki Nakano

Toshiaki Iwanaga

A test pattern including a first test mark which is one unit-record-length longer than a shortest mark among modulating codes and a second test mark which is two or more unit-record-lengths longer than the shortest mark is recorded under a plurality of recording conditions (step S). The recorded test pattern is reproduced (step S), and based on a plurality of reproduced signals thus obtained, recording conditions allowing the first test mark and the second test mark, respectively, to be suitably recorded are selected (step S). A recording condition for the shortest mark is determined by inference based on the recording conditions of the first test mark and the second test mark.

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Tokyo, Japan

Tutomu Ichimura