Sony Corporation

Sony Group Corporation

Tuo Zhuang

Yasutaka Hirasawa

Yuhi Kondo

Ying Lu

Shun Kaizu

Teppei Kurita

Legong Sun

Hideki Oyaizu

Hajime Mihara

A modulator according to the embodiment is a modulator provided between a diffraction grating and an image sensor. The modulator receives a light ray directed to the image sensor from the diffraction grating, and changes a travel direction of the light ray emitted toward the image sensor so as to bend a recording direction of a diffraction image for each wavelength of the light ray on a light receiving surface of the image sensor.

Modulator, imaging apparatus, and design method

A normal candidate information generation unit of an information processor generates normal candidate information for each pixel indicating, for example, a zenith angle, or an azimuth angle, or a zenith angle and an azimuth angle, on the basis of a polarization image in a plurality of polarization directions obtained by a polarization imaging unit. The in-plane pixel selection unit selects a plurality of pixels indicating the plane to be observed in the polarization image. A normal calculation unit calculates a normal of the plane to be observed on the basis of the normal candidate information of the pixels selected by the in-plane pixel selection unit.

Information processing apparatus and method for processing information

Provided is a polarization imaging unit that acquires a polarization image using a lens. In a parameter storage unit of an information processing unit, parameters related to a change in polarization state due to the lens which are estimated in advance from polarization state information acquired by imaging a light source in a predetermined polarization state using the lens and polarization state information indicating the polarization state of the light source, for example, change parameters indicating the change in polarization state due to the lens or correction parameters for correcting the change in polarization state due to the lens are stored. A polarization state correction unit of the information processing unit corrects the change in polarization state due to the lens, using the parameters stored in advance in the parameter storage unit.

Information processing apparatus, information processing method, and calibration apparatus

To implement a configuration for enabling independent adjustment of a spatial resolution and a wavelength resolution of a spectroscopic measurement device. A spatial resolution adjustment unit configured to adjust a spatial resolution of the spectroscopic measurement device, and a wavelength resolution adjustment unit configured to adjust a wavelength resolution of the spectroscopic measurement device are included, and the spatial resolution adjustment unit maintains output light from a condensing unit to a spectroscopic imaging unit of the spectroscopic measurement device as parallel light, adjusts a parameter of a constituent element of the condensing unit, and changes the spatial resolution without changing the wavelength resolution of the spectroscopic measurement device. The wavelength resolution adjustment unit adjusts a parameter of a spectroscopic imaging unit of the spectroscopic measurement device and changes the wavelength resolution without changing the spatial resolution of the spectroscopic measurement device.

Spectroscopic measurement device and spectroscopic measurement method

Provided are an apparatus and method for measuring the shape and thickness of a transparent object. A light projecting section that outputs beams of light to a transparent object, a light receiving sensor that receives the beams of light that have passed through the transparent object, and a data processing section that analyzes a received light signal in each light receiving element of the light receiving sensor are included. The light projecting section outputs, in parallel, output beams of light from a plurality of light sources, and the data processing section analyzes the received light signal in each light receiving element of the light receiving sensor and identifies a light source of any beam of light input into one light receiving element by using light source combination information that is stored in a storage section and that corresponds to a value of the received light signal.

Object shape measurement apparatus and method

A correction information generation sectionemits measurement light having uniform intensity onto a polarized image acquisition sectionacquiring a polarized image. Further, on the basis of a measured polarized image acquired from the polarized image acquisition section, the correction information generation sectiongenerates variation correction information for correcting sensitivity variations caused in the measured polarized image due to difference in polarization direction, and causes a correction information storage sectionto store the generated variation correction information. A correction processing sectionthen corrects the sensitivity variations caused in the polarized image acquired by the polarized image acquisition sectiondue to the difference in polarization direction by using the pre-generated variation correction information stored in the correction information storage section. Therefore, the polarized image outputted from the correction processing sectionbecomes a high-quality polarized image with, for example, its sensitivity variations corrected.

Image processing device, information generation device, and information generation method

An image processing device and a method that enable removal of reflection component light from images captured from various directions are provided. The image processing device includes: an image input unit that acquires at least three types of images formed with polarization images of different polarizing directions or non-polarization images; an angle input unit that outputs reflection angles that are the angles between the image capturing directions of the acquired images and the plane direction corresponding to the normal direction of the reflecting surface, to an intensity transmittance and intensity reflectance calculation unit; a calculation unit that calculates the respective intensity transmittances and the respective intensity reflectances of S waves and P waves, using the reflection angles; and a reflection component separation unit that removes the reflected light component from the images acquired by the image input unit, using the respective intensity transmittances and the respective intensity reflectances of the S waves and P waves. These processes enable removal of reflected light components from captured images having various reflection angles.

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Tokyo, Japan

Tuo Zhuang