International Business Machines Corporation

Qualcomm Incorporated

Tung Nang Pham

Alan G Lewis

Timothy Michael Skergan

Martin Saint-Laurent

Nam Dang

Rajeev Jain

Paras Gupta

Swarna Navubothu

Joshua P Hernandez

Daniel W Cervantes

Joseph Terregrossa

Somasekhar Maradani

Aspects of the disclosure are directed to voltage-based current sensing. In accordance with one aspect, voltage-based current sensing may include performing a coarse calibration of a voltage based current sensor to determine a coarse offset; performing a fine calibration of the voltage based current sensor to determine a fine offset; performing a frequency calibration of the voltage based current sensor to determine a frequency offset; and performing a transfer function calibration of the voltage based current sensor to determine a sensor transfer function using one or more of the coarse offset, the fine offset and the frequency offset; and measuring a load current using the sensor transfer function.

Differential current sensing with robust path, voltage offset removal and process, voltage, temperature (PVT) tolerance

A method to reduce logic built in self test manufacturing test time of integrated circuits, comprising: loading a plurality of test seeds in bulk into a locally accessible on-chip memory array locally disposed on an integrated circuit, each of the plurality of test seeds is associated with a set of LBIST control information; sending the plurality of test seeds from the locally accessible on-chip memory array repetitively into a pseudo-random pattern generator one at a time during an LBIST operation being under the control from the set of LBIST control information; generating random bit streams serially into a plurality of parallel shift registers of the integrated circuit through the use of the plurality of test seeds; and performing a logic built-in self test on a plurality of logic blocks in the integrated circuit to detect defects within the integrated circuit.

System and method to reduce LBIST manufacturing test time of integrated circuits

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Austin, TX, United States of America

Tung Nang Pham