National Institute for Materials Science

Tung Anh Doan

Tadaaki Nagao

Duc Thien Ngo

Ryo Tamura

Provided is to perform an identification of a temperature and/or a material of a target object to be measured in a non-contact and simple manner. A relationship between a wavelength and an emissivity of thermal radiation such as infrared rays radiated from an object is determined by the material of the object. In the present invention, the identification is performed by using this. In other words, the object above can be achieved by comparing thermal radiation intensities at a plurality of wavelengths from the given object with a database in the present invention. The database is stored by measuring the thermal radiation intensities at the plurality of wavelengths and temperatures for a plurality of materials in advance. An external light source is not required, and the target to be measured itself is used as a thermal radiation light source in this measurement.

Method of non-contact material identification, method of non-contact temperature identification, and method for identifying progress of heat treatment processing

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Ibaraki, Japan

Tung Anh Doan